Abstract
This article introduces the topic of energy-filtered transmission electron microscopy (EFTEM). It reviews the technique combining theory with a number of applications from materials science to highlight the progress made in the subject. Examples of EFTEM of catalysts are also reviewed with a discussion of how the technique could be used to study many more catalyst structures in the future.
Similar content being viewed by others
References
O.L. Krivanek, A.J. Gubbens, N. Dellby and C. Meyer, Microsc. Microanal. Microstruct. 3 (1992) 187.
S. Lanio, H. Rose and D. Krahl, Optik 73 (1986) 56.
P. Rez, J. Bruley, P. Brohan, M. Payne and L.A.J. Garvie, Ultramicroscopy 59 (1995) 159.
D.H. Pearson, C.C. Ahn and B. Fultz, Phys. Rev. 47 (1993) 8471.
T. Malis, S.C. Cheng and R.F. Egerton, J. Electron Microsc. Techn. 8 (1988) 193.
J. Daniels, C.V. Festenberg, H. Raether and K. Zeppenfeld, in: Springer Tracts in Modern Physics, Vol. 54 (Springer-Verlag, New York, 1970) p. 78.
F.J. Himpsel, J.E. Orgeta, G.J. Mankey and R.F. Willis, Adv. Phys. 47 (1998) 511.
A.M. Fox, Contemp. Phys. 37 (1996) 111.
P. Rez, Ultramicroscopy 28 (1989) 16.
D.K. Saldin and J.M. Yao, Phys. Rev. B 41 (1990) 52.
D.C. Joy, A.D. Romig and J.I. Goldstein (eds.), Principles of Analytical Electron Microscopy (Plenum Press, New York, 1986).
S.C. Cheng and R.F. Egerton, Ultramicroscopy 16 (1985) 279.
R.F. Egerton, Microsc. Microanal. Microstruct. 2 (1991) 203.
DÌ` Maher, D.C. Joy, R.F. Egerton and P. Mochel, J. Appl. Phys. 50 (1979) 5105.
F. Hofer and G. Kothleitner, Microsc. Microanal Microstruct. 4 (1993) 539.
M. Isaacson, in: Proc. 38th EMSA Meeting, 1980, p. 110.
M. Unser, J.R. Ellis, T. Pun and M. Eden, J. Microsc. 145 (1986) 245.
R.F. Egerton, in: Microbeam Aanlysis, ed. K.F.J. Heinrich (San Francisco Press, San Francisco, 1982) p. 43.
A. Berger and H. Kohl, Optik 92 (1993) 175.
G. Kothleitner and F. Hofer, Micron 29 (1998) 349.
D.-R. Liu and L.M. Brown, J. Microsc. 147 (1987) 37.
D.C. Joy and D.M. Maher, J. Microsc. 124 (1981) 37.
J. Van Puymbroeck, W. Jacob and P. Van Espen, J. Microsc. 166 (1992) 273.
D.W. Johnson and J.C.H. Spence, J. Phys. D 7 (1974) 71.
R.F. Egerton and M.J. Whelan, Phil. Mag. 30 (1974) 739.
P.A. Crozier Phil. Mag. B 61 (1990) 311.
P. Schattschneider, M. Nelhiebel, M. Schenner, W. Grogger and F. Hofer, J. Microsc. 183 (1996) 18.
N.J. Zaluzec, J. Hren and R.W. Carpenter, in: 38th Ann. Proc. Electron Microscopy Society of America, 1980.
M. Scenner, M. Nelhiebel and P. Schattschneider, Ultramicroscpy 65 (1996) 95.
Z.L. Wang, Acta Crystallogr. A 48 (1992) 674.
R.F. Egerton, Ultramicroscopy 3 (1978) 243.
F. Hofer, Ultramicroscopy 21 (1987) 63.
F. Hofer, P. Golob and A. Brunegger, Ultramicroscopy 25 (1988) 81.
F. Hofer and P. Wilheim, Ultramicroscopy 49 (1993) 189.
T. Malis and J.M. Tichmarsh, Inst. Phys. Conf. Ser. 78 (1985) 181.
R.D. Leapman, in: Microbeam Analysis 1986, eds. A.D. Romig and W.F. Chambers (San Francisco Press, San Francisco, 1986) p. 187.
F. Hofer, W. Grogger, G. Kothleitner and P. Warbichler, Ultramicroscopy 67 (1997) 83.
R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1996).
D.C. Joy, R.F. Egerton and D.M. Maher, in: Scanning Electron Microscopy, ed. A.M.F. O'Hare (SEM, Illinois, 1979) p. 817.
R.F. Egerton and S.C. Cheng, Ultramicroscopy 24 (1987) 231.
C. Jeanguillaume and C. Colliex, Ultramicroscopy 28 (1989) 252
J.A. Hunt and D.B. Williams, Ultramicroscopy 38 (1991) 47.
D. Özkaya, J. Yuan, L.M. Brown and P.E.J. Flewitt, J. Microsc. 180 (1995) 300.
C. Colliex, Ultramicroscopy 18 (1985) 131.
R.D. Leapman and J.A. Hunt, Micros. Microanal. Microstruct. 2 (1991) 231.
C.C. Ahn and O.L. Krivanek, EELS Atlas (Gatan, Warrendale, PA, 1983).
P.J. Thomas and P.A. Midgley, Ultramicroscopy 88 (2001) 179.
P.J. Thomas and P.A. Midgley, Ultramicroscopy 88 (2001) 187.
L. Reimer (ed.), Energy-Filtering Transmission Electron Microscopy, Vol. 71, Springer Series in Optical Sciences (Springer-Verlag, Berlin, 1995).
P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley and M.J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965) p. 92.
M.T. Otten, in: Philips Electron Optics Special Bulletin (Philips, Eindhoven, 1993) p. 4.
G. Zanchi, Y. Kihn and J. Sevely, Optik 60 (1982) 427.
O.L. Krivanek, A.J. Gubbens and N. Dellby, Microsc. Microanal. Microstruct. 2 (1991) 315.
O.L. Krivanek and P.E. Mooney, Ultramicroscopy 49 (1993) 95.
W.J. De Ruijter, Micron 26 (1995) 247.
R.R. Meyer and A.I. Kirkland, Ultramicroscopy 75 (1998) 23.
A.L. Weikenmeier, W. Nüchter and J. Mayer, Optik 99 (1995) 147.
R.F. Egerton and P.A. Crozier, Micron 28 (1997) 117.
P.A. Crozier, in: Proc. Microscopy and Microanalysis, eds. G.W. Bailey, M.H. Ellisan, R.A. Hennigar and N.J. Zaluzec, 1995, p. 304.
H. Kohl and A. Berger, Ultramicroscopy 59 (1995) 191.
A. Berger and H. Kohl, Microsc. Microanal. Microstruct. 3 (1992) 159.
O.L. Krivanek, M.K. Kundmann and K. Kimoto, J. Microsc. 180 (1995) 277.
S.J. Pennycook, Contemp. Phys. 59 (1982) 371.
R.F. Egerton, Inst. Phys. Conf. Ser. (EMAG 97) 153 (1997) 149.
F.P. Otenmeyer and J.W. Andrew, J. Ultrastructure Res. 72 (1980) 336.
A. Haking, H. Troester, K. Richter, C. Crucifix, H. Spring, and M.F. Trendelburg, Ultramicroscopy 80 (1999) 163.
D.P. Bazettjones and F.P. Ottensmeyer, Science 211 (1981) 169.
P. Trebbia and N. Bonnet, Ultramicroscopy 34 (1990) 165.
F. Hofer and P. Warbichler, Ultramicroscopy 63 (1996) 21.
P.A. Crozier, Ultramicroscopy 58 (1995) 157.
L. Reimer, Mater. Trans. 39 (1998) 873.
J. Mayer, U. Eigenthaler, J.M. Plitzko and F. Dettenwanger, Micron 28 (1997) 361.
P.J. Thomas, P.A. Midgley and P. Spellward, Inst. Phys. Conf. Ser. (EMAG 99) (1999).
C. Jeanguillaume, P. Trebbia and C. Colliex, Ultramicroscopy 3 (1978) 237.
R.D. Leapman and C.R. Swyt, in: Microbeam Analysis 1983, ed. R. Gooley (San Francisco Press, San Francisco, 1983).
D.E. Johnson, in: Introduction to Analytical Electron Microscopy (Plenum Press, New York, 1979) p. 245.
O.L. Krivanek, A.J. Gubbens, M.K. Kundmann and G.C. Carpenter, in: 51st Ann. Proc. Electron Microscopy Society of America, 1993, p. 586.
F. Hofer, P. Warbichler and W. Grogger, Ultramicroscopy 59 (1995) 15.
P. Warbichler, F. Hofer, P. Hofer and E. Lotofsky, Micron 29 (1998) 63.
F. Hofer, P. Warbichler, W. Grogger and O. Lang, Micron 26 (1995) 377.
J.L. Lavergne, C. Foa, P. Bongrand, D. Seux and J.M. Martin, J. Microsc. 174 (1994) 195.
K.H. Körtje, J. Microsc. 174 (1994) 149.
J.M. Plitzko and J. Mayer, J. Microsc. 183 (1996) 2.
J. Lavergne, J. Martin and B. Belin, Microsc. Microanal. Microstruct. 3 (1992) 517.
R.F. Leapman and J.A. Hunt, J. Microsc. Soc. Am. 3 (1995) 93.
J.-M. Martin, J.-L. Lavergne, B. Vacher and K. Inoue, Microsc. Microanal. Microstruct. 6 (1995) 53.
J. Mayer and J.M. Plitzko, J. Microsc. 183 (1995) 2.
J.M.M. Martin, B. Vacher, L. Ponsonnet and V. Dupuis, Ultramicroscopy 65 (1996) 229.
J. Marien, J.M. Plitzko, R. Spolenak, R.-M. Keller and J. Mayer, J. Microsc. 194 (1998) 71.
J.M. Plitzko and J. Mayer, Ultramicroscopy 78 (1999) 207.
G. Deshais, PhD Thesis, University of Cambridge, 1999.
J. Yuan, L.M. Brown, J. Walmsley and S.B. Fisher, J. Microsc. 180 (1995) 313.
J.N. Chapman, J.D. Steele, J.H. Paterson and J.M. Titchmarsh, Inst. Phys. Conf. Ser. 78 (1985) 177.
H.M. Chan and D.B. Williams, Phil. Mag. B 52 (1985) 1019.
ELP software v 2.1, 1993, Gatan Inc., 6678 Owens Drive, Pleasanton, CA 94588-3334 USA.
F. Hofer, G. Kothleitner and P. Rez, Ultramicroscopy 63 (1996) 239.
A. Rose, Image Technol. 12 (1970) 1315.
P.J. Thomas and P.A. Midgley, Inst. Phys. Conf. Ser. (EMAG 99) (1999).
R.D. Leapman and C.R. Swyt, in: Analytical Electron Microscopy, ed. R.H. Geiss (San Francisco Press, San Francisco, 1981) p. 164.
F. Cesar, J-O. Bovin, L.R. Wallenberg, G. Karlsson, L.K.L. Falk and T. Oku, J. Mater. Res. 15 (2000) 1857.
T.C. Rojas, M.J. Sayagues, A. Caballero, Y. Koltypin, A. Gedanken, L. Ponsonnet, B. Vacher, J.M. Martin and A. Fernandez, J. Mater. Chem. 10 (2000) 715.
M. Hytch, Y. Champion and P. Bayle-Guillemaud (unpublished data).
P.A. Midgley, M. Weyland, J.M. Thomas and B.F.G. Johnson, Chem. Commun. 18 (2001) 907.
M. Weyland, P.A. Midgley and J.M. Thomas, J. Phys. Chem. B 105 (2001) 7882.
M. Weyland and P.A. Midgley, Inst. Phys. Conf. Ser. 168 (2001) 239.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Thomas, P., Midgley, P. An Introduction to Energy-Filtered Transmission Electron Microscopy. Topics in Catalysis 21, 109–138 (2002). https://doi.org/10.1023/A:1021377125838
Issue Date:
DOI: https://doi.org/10.1023/A:1021377125838