Abstract
Refracted X-ray fluorescence (RXF) is arelatively new technique developed for studyingproperties of thin films. In this paper, formalism foranalysis of RXF measurements is derived from a newperspective. The technique is applied to the study ofthermally grown oxide scales; model predictions aretested. The evolution of chromia scales onFe-25Cr-20Ni-0.3Y alloys and some aspects of aluminascales grown on β-NiAl are investigated. Some of thedata were taken in situ, during the oxidation process.Deposited films of Fe-25Cr-20Ni-0.3Y alloys of varyingthickness and the oxidation of those films were also studied. The technique is generally applicableto thin-film studies. It provides scale-composition anddepth-profile information, scale thicknesses and growthrates, and information about transient-phase evolution.
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Koshelev, I., Paulikas, A.P. & Veal, B.W. Refracted X-Ray Fluorescence (RXF) Applied to the Study of Thin Films and Thermally-Grown Oxide Scales. Oxidation of Metals 51, 23–54 (1999). https://doi.org/10.1023/A:1018898018004
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DOI: https://doi.org/10.1023/A:1018898018004