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High Precision Characterisation of Semiconductor Bolometers

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Abstract

We describe techniques for testing and characterising semiconductor bolometers, using the bolometer model presented in Sudiwala et. al. [1]. The procedures are illustrated with results from a prototype bolometer for the high frequency instrument (HFI) in the Planck Surveyor cosmic microwave background mission. This is a bolometer using spider-web geometry and a neutron transmutation doped (NTD) germanium thermistor, designed for operation at 100 mK. Details are given of the laboratory facility used to take data at temperatures from 70 mK to 350 mK. This employs an adiabatic demagnetisation refrigerator to cool the detector and optics. The spatial and spectral properties of the optical system are controlled using feedhorns and edge filters. To characterise the bolometer, blanked and optically loaded load curves were measured over a range of temperatures, and the response to modulated radiation was measured as a function of modulation frequency, temperature and bias current. Results for the prototype bolometer show that its behaviour is well represented by an ideal thermal detector down to a temperature of approximately 100 mK. Below this, non-thermal effects such as electron-phonon decoupling or electric field dependent resistance appear to lead to departure from ideal behaviour. The performance was in good agreement with the design goals for the bolometer.

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Woodcraft, A.L., Sudiwala, R.V., Griffin, M.J. et al. High Precision Characterisation of Semiconductor Bolometers. International Journal of Infrared and Millimeter Waves 23, 575–595 (2002). https://doi.org/10.1023/A:1015757810970

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