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A Technique for the Mass Testing of Single-Sided Microstrip Detectors

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Abstract

In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000.

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REFERENCES

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Authors and Affiliations

  1. Skobel'tsyn Institute of Nuclear Physics, Moscow State University, Vorob'evy gory, Moscow, 119899, Russia

    P. F. Ermolov, A. G. Voronin, E. G. Zverev, D. E. Karmanov, E. N. Kuznetsov, A. K. Leflat, M. M. Merkin & E. K. Shabalina

Authors
  1. P. F. Ermolov
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  2. A. G. Voronin
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  3. E. G. Zverev
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  4. D. E. Karmanov
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  5. E. N. Kuznetsov
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  6. A. K. Leflat
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  7. M. M. Merkin
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  8. E. K. Shabalina
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Ermolov, P.F., Voronin, A.G., Zverev, E.G. et al. A Technique for the Mass Testing of Single-Sided Microstrip Detectors. Instruments and Experimental Techniques 45, 194–206 (2002). https://doi.org/10.1023/A:1015308400067

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  • DOI: https://doi.org/10.1023/A:1015308400067

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