Measuring the Dielectric Permittivity of Sapphire at Temperatures 93–343 K

Abstract

We consider a method for measuring the elements of the dielectric-permittivity tensor of a slightly lossy uniaxial anisotropic dielectric using the spectrum of resonance frequencies of a metal-dielectric resonator in the form of an axially anisotropic cylindrical specimen with endface metal mirrors. Measurements of both elements of the dielectric-permittivity tensor of sapphire at temperatures 93–343 K are performed using the spectrum of symmetric E modes. To avoid the influence of the residual gaps between the specimen and the mirrors, the endface surfaces of the specimen are metallized. We performed independent measurements of the axial and transverse elements of the permittivity tensor at room temperature from the spectra of azimuthal E modes and symmetric H modes. The values of the axial and transverse elements of the dielectric-permittivity tensor of sapphire in the range 93–343 K are presented with a spacing of 10 K.