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Thickness Measurements of Thin CsI(Tl) Scintillators

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Abstract

A γ-activation method for measuring the thickness of thin CsI(Tl) polycrystalline films deposited by evaporation on large-area (∼150 cm2) backings is described. Scintillators specially prepared to be used in the FASA installation as detectors of intermediate-mass fragment multiplicity were measured. It was shown that the distribution of the film thickness along the scintillator surface can be determined by β-activity scanning. It has been shown that the film thickness decreases from the middle of the backing to its periphery by ≈25% for scintillators with a linear size of 140 mm.

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Authors and Affiliations

  1. Joint Institute for Nuclear Research, ul. Joliot Curie 6, Dubna, Moscow oblast, 141980, Russia

    S. P. Avdeyev, V. A. Karnaukhov, V. D. Kuznetsov, L. A. Petrov & V. K. Rodionov

  2. Niewodniczanskii Institute of Nuclear Physics, Crakow, Poland

    W. Karcz & M. Janitcki

  3. Technical University, Darmstadt, Germany

    H. Oeschler

Authors
  1. S. P. Avdeyev
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  2. V. A. Karnaukhov
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  3. V. D. Kuznetsov
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  4. L. A. Petrov
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  5. V. K. Rodionov
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  6. W. Karcz
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  7. M. Janitcki
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  8. H. Oeschler
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Avdeyev, S.P., Karnaukhov, V.A., Kuznetsov, V.D. et al. Thickness Measurements of Thin CsI(Tl) Scintillators. Instruments and Experimental Techniques 44, 634–637 (2001). https://doi.org/10.1023/A:1012393423063

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  • DOI: https://doi.org/10.1023/A:1012393423063

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