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Pb(Mg1/3Nb2/3)0.97Ti0.03O3 Ferroelectric Thin Films, Deposited by Laser Ablation on TiN Bottom Electrodes

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Abstract

Pb(Mg1/3Nb2/3)0.97Ti0.03O3 (PMNT) polycrystalline thin films were deposited on Titanium Nitride electrode at different temperatures by laser ablation, using a wavelength of 248 nm. The morphology of the films was analyzed by scanning electron microscopy (SEM). The nature of the ferroelectric layer-electrode interface is studied by transmission electron microscopy (TEM) as well as the effect of its characteristics in the performance of the multilayer system. The influence of the annealing temperature on the dielectric properties was studied by hysteresis and fatigue measurements.

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Authors and Affiliations

  1. Posgrado de Física de Materiales, Centro de Investigación Científica y de Educaciín Superior de Ensenada, Ensenada, B. Cfa., México

    A. Fundora, E. Martínez & O. E. Contreras

  2. Facultad de Física-IMRE, Universidad de la Habana, Vedado, La Habana, 10400, Cuba

    A. Fundora & H. Amorín

  3. Centro de Ciencias de la Materia Condensada, Universidad Nacional Autónoma de México, b, Apartado Postal 2681, Ensenada, Baja California., México

    H. Amorín & J. M. Siqueiros

Authors
  1. A. Fundora
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  2. E. Martínez
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  3. H. Amorín
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  4. O. E. Contreras
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  5. J. M. Siqueiros
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Fundora, A., Martínez, E., Amorín, H. et al. Pb(Mg1/3Nb2/3)0.97Ti0.03O3 Ferroelectric Thin Films, Deposited by Laser Ablation on TiN Bottom Electrodes. Journal of Electroceramics 6, 21–25 (2001). https://doi.org/10.1023/A:1011465502307

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  • DOI: https://doi.org/10.1023/A:1011465502307

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