Abstract
Opens in interconnection paths disconnect the driven gate(s) from the driving gate. Detectability conditions to test full opens in interconnections are investigated. It has been found that the detectability of this defect depends strongly on the signals at the driving gate and coupling lines. Three possible situations are analyzed. The first is when there is full controllability of both the signal driving the open and the signal(s) at the coupling line(s). Then, the cases of partial and low controllability of the signals are analyzed. Conditions for reliable detection of this defect by logic and IDDQ testing have been determined. In addition, it has been found that the detectability of interconnection opens depends on the metal level where the signals are laid-out. Routing design for testability techniques are recommended for some interconnection opens non detectable by either a stuck-at based or IDDQ testing. Experimental data on intentionally designed defective circuit is presented.
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Zenteno, A., Champac, V.H. & Figueras, J. Detectability Conditions of Full Opens in the Interconnections. Journal of Electronic Testing 17, 85–95 (2001). https://doi.org/10.1023/A:1011179007753
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DOI: https://doi.org/10.1023/A:1011179007753