Abstract
Thin films of lead lanthanum titanate (Pb,La)TiO3 have been grown by radio-frequency magnetron sputtering on (0001) Al2O3 substrates. The structure, the microstructure and the optical properties of the films have been investigated as a function of the postdeposition annealing. Films deposited at low temperatures crystallize to a perovskite phase after the annealing treatment from 500°C to 650°C. X-ray (θ−2θ) diffraction studies have shown that films are crystallized with a strong (111) orientation and the best crystalline structure is reported at 600°C. The optical properties were both demonstrated by spectrophotometry and prism coupling. PLT thin films with a transparency of 80% in the wavelength range 300–2000 nm have exhibited a refractive index of 2.38 @ 632.8 nm representing 97% of the bulk corresponding material. Investigation of optical propagation has been accomplished in a 10 mm long planar optical waveguide using a butt-coupling configuration.
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Dogheche, E., Jaber, B. & Rèmiens, D. Optical Waveguiding Properties of (Pb,La)TiO3/Al2O3 Planar Structures. Journal of Electroceramics 2, 105–111 (1998). https://doi.org/10.1023/A:1009931107964
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DOI: https://doi.org/10.1023/A:1009931107964