Abstract
An integrated digital CMOS time-to-digital converter with sub-gate delay LSB width and 50 ps single-shot precision σ-value has been designed and implemented for a laser range-finding application. The measurement is based on a counter and a novel two-step parallel interpolation that uses only 32 delay elements to provide 128 LSBs in the interpolator within the reference clock cycle. The circuit was fabricated in the AMS 0.8 μm CMOS process and the current consumption of the circuit is <20 mA from a single +5 V supply.
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K. Mää ttä, J. Kostamovaara, and R. Myllylä, “Time-to-digital converter for fast, accurate laser rangeÆnding.” Proc. SPIE International Conference on Industrial Inspection (ECO1), pp. 60–67, 1988, Hamburg.
Hewlett-Packard, “Fundamentals of Time Interval Measurements.” Application Note 200-3.
M. Mota and J. Christiansen, “A four channel self-calibrating, high resolution, time To digital converter.” Proc. ICECS 1998 1, Lisbon, Portugal, pp. 409–412, 1998.
T. Rahkonen and J. Kostamovaara, “The use of stabilized CMOS delay lines in the digitization of short time intervals.” IEEE Journal of Solid State Circuits 28(8), pp. 887–894, 1993.
M. S. Gorbics, J. Kelly, K. M. Roberts, and R. L. Sumner, “A high resolution multihit time to digital converter integrated circuit.” IEEE Transactions on Nuclear Science 44(3), pp. 379–384, 1997.
R. Myllylä, J. Marszalec, A. Mäntyniemi, J. Kostamovaara, S. Vainshtein, V. Heikkinen, and J. L. Zhang, “Imaging lidar for space and industrial applications.” New Image Processing Techniques and Applications: Algorithms, Methods and Components II, Proceedings of SPIE, 3101, Munich, pp. 331–340, 1997.
A. Mäntyniemi, T. Rahkonen, and J. Kostamovaara, “A 9-channel time-to-digital converter for an imaging lidar application.” Proc. ESSCIRC'97, pp. 232–235, 1997, Southampton.
J. Bastos, M. Steyaert, R. Roovers, P. Kinget, W. Sansen, B. Graindourze, A. Pergoot, and E. Janssens, “Mismatch characterization of small size MOS transistors.” Proc. Int. Conference on Microelectronic Test Structures, Japan, 8, 1995.
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Ma¨ntyniemi, A., Rahkonen, T. & Kostamovaara, J. An Integrated Digital CMOS Time-to-Digital Converter with Sub-Gate-Delay Resolution. Analog Integrated Circuits and Signal Processing 22, 61–70 (2000). https://doi.org/10.1023/A:1008324127398
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DOI: https://doi.org/10.1023/A:1008324127398