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Modeling and interference-microscopy characterization of graded index transitions in ion-exchange waveguide integrated elements: transitions between annealed surfaces

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Abstract

We employ interference microscopy to characterize in a direct and local way the graded index transitions at the boundaries of integrated optical elements fabricated by multistep ion-exchange processes, a task not yet possible by other technologies. A particular fabrication method based on purely thermal ion-exchange, which allows local single-mode propagation, is investigated. The refractive-index distribution is modeled on the basis of the linear theory of diffusion and adiabatic transitions of the refractive-index profile. Finally, its validity is analyzed by microinterferometry.

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Authors and Affiliations

  1. Laboratorio de Optica, Departamento de Fisica Aplicada, Facultade de Fisica e Escola Universitaria de Optica e Optometria, Universidade de Santiago de Compostela, E-15076, Santiago de Compostela, Galicia, Spain

    E. Lopez-Lago & J. Liñares

  2. McKinsey & Company, Mannerheimintie 14 A, FIN-00100, Helsinki, Finland

    R.-P. Salmio

  3. Materials Physics Laboratory, Department of Engineering Physics and Mathematics, Helsinki University of Technology, P.O. Box 2200, FIN-02015, HUT, Espoo, Finland

    J. Saarinen

  4. Department of Physics, University of Joensuu, P.O. Box 111, Fin-80101, Joensuu, Finland

    M. Kuittinen & J. Turunen

  5. Heptagon Oy, Tekniikantie 12 (Innopoli), FIN-02150, Espoo, Finland

    P. Vahimaa

Authors
  1. E. Lopez-Lago
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  2. J. Liñares
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  3. R.-P. Salmio
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  4. J. Saarinen
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  5. M. Kuittinen
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  6. J. Turunen
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  7. P. Vahimaa
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Lopez-Lago, E., Liñares, J., Salmio, RP. et al. Modeling and interference-microscopy characterization of graded index transitions in ion-exchange waveguide integrated elements: transitions between annealed surfaces. Optical and Quantum Electronics 32, 1269–1281 (2000). https://doi.org/10.1023/A:1007087817512

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  • DOI: https://doi.org/10.1023/A:1007087817512

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