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Effect of copper on the electrical properties of K1.6(Mg1−yCuy)0.8Ti7.2O16 ceramics

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Abstract

The electrical conductivity of the K1.6(Mg1−yCuy)0.8Ti7.2O16 ceramics has been investigated as a function of copper fraction (0≤y≤1). At the calcination temperature of 1000°C, a tetragonal-single phase was obtained for the all compositions. In the specimens sintered at 1100°C for 4 h, the electrical conductivity of the specimens increased with the increasing copper fraction, y. This result can be explained by the weakness of the K–O bonding and the increase of the bulk density and grain size. For the specimens with copper fraction (0≤y<0.8), the electrical conduction was developed mainly by ionic conduction while electronic conduction abruptly occurred at copper fraction y≥0.8. This resulted from the valence transition of copper ions associated with the formation of oxygen vacancies.

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Authors and Affiliations

  1. Department of Ceramic Engineering, Yonsei Univ., 120-749, Seoul, Korea

    Ki Hyun Yoon

  2. Department of Electronic Materials Engineering, University of Suwon, Korea

    Sung Han

  3. Department of Material Engineering, Andong National University Andong, Korea

    Dong Heon Kang

Authors
  1. Ki Hyun Yoon
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  2. Sung Han
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  3. Dong Heon Kang
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  4. Tae Heui Kim
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Yoon, K.H., Han, S., Kang, D.H. et al. Effect of copper on the electrical properties of K1.6(Mg1−yCuy)0.8Ti7.2O16 ceramics. Journal of Materials Science 33, 417–421 (1998). https://doi.org/10.1023/A:1004380015500

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