Abstract
Anodic oxide films on some Ti–Al alloys are studied using fast-electron reflection diffraction, Rutherford backscattering, and secondary neutral-particle mass spectrometry. The films are amorphous, with a small amount of crystalline phases, and comprise a mixture of TiO2 and Al2O3. The Ti/Al ratio in an anodic film corresponds to that in the alloy matrix. Constants of anodic oxidation of the alloys are determined.
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Kamkin, A.N., Fishgoit, L.A. & Davydov, A.D. Composition and Structure of Anodic Oxide Films on Titanium–Aluminum Alloys by Fast Electron Reflection Diffraction, Rutherford Backscattering, and Secondary Neutral Particle Mass Spectrometry. Russian Journal of Electrochemistry 39, 665–670 (2003). https://doi.org/10.1023/A:1024113613516
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DOI: https://doi.org/10.1023/A:1024113613516