Abstract
Mass spectra were studied for silylated destruction products of toxic chemicals that belong to classes of alkylphosphonic, alkylthiophosphonic, and dialkylamidophosphoric acid derivatives. The analysis of mass spectra and the study of regularities in the fragmentation of some compounds of these classes revealed some characteristic features of the formation of fragment ions by electron impact. These features are related to the formation of ions that include the phosphoryldimethylcyclosiloxane or phosphorylthiodimethylcyclosiloxane fragment, and their formation is responsible for the majority of the most intense characteristic peaks in the mass spectrum.
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Vasilevskii, S.V., Kireev, A.F., Rybal'chenko, I.V. et al. Identification of Silylated Derivatives of Alkylphosphonic, Alkylthiophosphonic, and Dialkylamidophosphoric Acids by Mass Spectrometry. Journal of Analytical Chemistry 57, 491–497 (2002). https://doi.org/10.1023/A:1015789600571
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DOI: https://doi.org/10.1023/A:1015789600571