Abstract
The sensitivity of dopant-assisted atmospheric pressure photoionization (DA-APPI) for LC/MS is generally reduced at higher solvent flow rates. Theory suggests that quenching of excited-state precursors to the dopant ions, via collisions with vaporized solvent molecules, may be one mechanism responsible for this trend. To ascertain if the primary rate of ionization is affected by quenching, experiments were performed utilizing an ionization detector to determine the primary ion current generated by irradiating vaporized mixtures of toluene dopant and methanol solvent. The results indicate that no loss of primary ion current occurs as the solvent flow is increased, provided the dopant-to-solvent ratio is held constant. Additional primary ion current can always be generated by increasing the dopant flow rate and/or the lamp power. Thus, quenching of excited-state precursors to the dopant ions, leading to a reduction in the primary rate of ionization, is not the mechanism responsible for the observed loss of sensitivity at higher liquid solvent flow rates.
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Published online January 18, 2006
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Robb, D.B., Blades, M.W. Factors affecting primary ionization in dopant-assisted atmospheric pressure photoionization (DA-APPI) for LC/MS. The official journal of The American Society for Mass Spectrometry 17, 130–138 (2006). https://doi.org/10.1016/j.jasms.2005.09.013
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DOI: https://doi.org/10.1016/j.jasms.2005.09.013