Skip to main content
Log in

The Mechanics of Light Elevated Temperature Induced Degradation (LeTID) on PERC Module: A Review

  • Review Paper
  • Published:
Transactions on Electrical and Electronic Materials Aims and scope Submit manuscript

Abstract

Passivated emitter and rear contact (PERC) cells are financially commanding and rapidly increasing PV system in the energy market. Its efficiency decreases over time because of the Light-Induced degradation (LID) that follows countless hours of exposure to light (above 50oC temperature), and collectively is termed as Light and Elevated Temperature Induced Degradation (LeTID). Every PERC solar cell module experiences the LeTID effect significantly. Excessive hydrogen injection into Si bulk creates the atomic-level defect structure, which is mainly guilty for the LeTID. Therefore, the normal lifetime of PERC modules has become less, and ultimately levelized cost of electricity (LCOE) of installed systems is increasing. All c-Si types of PV devices are degraded by 5%, whereas the PERC module is degraded by up to 10% due to LeTID. Even, 16% power loss took place due to this kind of degradation, though an efficiency of 23.6% has been recorded for the PERC solar cells. The mono-crystalline Si solar cell module degraded (2-3.6) % while multi-Si solar cells module can be degraded up to (3.8–7.5) %. This study has covered the introduction and characterization of the LeTID, exploring the influencing factors for LeTID and mitigation techniques of decadence. LeTID on PERC module is altered depending on the variations of weather and the variety of cells used in PERC modules, which have been reported in this review. These insights will be helpful in finding a better understanding of the LeTID effect on the PERC module.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1

Reprinted from [7], with permission from MDPI.

Fig. 2

Reprinted from [8], with permission from MDPI.

Fig. 3
Fig. 4

Reprinted from [12], with permission from MDPI.

Fig. 5
Fig. 6

Reprinted from [31], with permission from Elsevier

Fig. 7

Similar content being viewed by others

References

  1. K. Anusuya, K. Vijayakumar, S. Manikandan, From efficiency to eternity: a holistic review of photovoltaic panel degradation and end-of-life management, Solar Energy, vol- 265 (2023) 112135, https://doi.org/10.1016/j.solener.2023.112135

  2. S. Huang, Grand challenges and opportunities in Photovoltaic materials and devices, Sec. Photovoltaic materials and devices. Front. Photon. 2 (2021). https://doi.org/10.3390/mi14030691]

  3. M. Theristis, J.S. Stein, C. Deline, D. Jordan, C. Robinson, W. Sekulic, A. Anderberg, D.J. Colvin, J. Walters, H. Seigneur, B.H. King, Onymous early-life performance degradation analysis of recent photovoltaic module technologies, 07 August 2022, <https: 10.1002="doi.org=” pip.3615="”></https:>

  4. A. Alimi, E.L. Meyer, O. I. Olayiwola Solar Photovoltaic Modules’ Performance Reliability and Degradation Analysis—A Review, Energies, Vol (15), Pages – 5964 (2022). [doi: https://www.mdpi.com/1996-1073/15/16/5964]

  5. A. Kumar, H. Ganesan, V. Saini, H.R. Almujibah, P. Petrouniasf, J.V. Muruga Lal Jeyan, S. Sharma, A. Agrawal, An assessment of photovoltaic module degradation for life expectancy: a comprehensive review. Eng. Fail. Anal. 156, 107863, (February 2024). https://doi.org/10.1016/j.engfailanal.2023.107863

  6. M.A. Zahid, H. Yousuf, M.D.A. Rabelo, S.B. Cho, Y.W. Yang, E. Cho, J. Yi, Analysis of Accelerated Damp Heat Test for Degradation Analysis and Recovery Method of Photovoltaic Module. Energy Technol. 10(2022). https://doi.org/10.1002/ente.202200707]

  7. M.G. Seok, J. Kim, Y. Lee, Y. Kim, Y. Kim, S.M. Kim, Treatment of Light-Induced Degradation for Solar Cells in a p-PERC Solar Module via induction heating. Solar Energy Photovolt. Systems: Energies. 14 (2021). https://doi.org/10.3390/en14196352]

  8. M.K. da Silva, M.S. Gul, H. Chaudhry, Energies, Review on the sources of power loss in Mono-facial and bifacial Photovoltaic technologies, 2021, 14, 7935. [https://doi.org/10.3390/en14237935]

  9. J. Schmidt, A. Cuevas, Electronic properties of light -induced recombination centers in boron-doped Czochralski silicon. J. Appl. Phys. 86, 3175–3180 (1999). https://doi.org/10.1063/1.371186]

    Article  CAS  Google Scholar 

  10. S.W. Glunz, S. Rein, J.Y. Lee, Warta,Minority carrier lifetime degradation in boron doped Czochralski silicon. J. Appl. Phys. 90, 2397–2404 (2001). https://doi.org/10.1063/1.1389076]

    Article  CAS  Google Scholar 

  11. R. Gottschalg, M. Pander, J. Bauer, M. Turek BENCHMARKING, LIGHT AND ELEVATED TEMPERATURE INDUCED DEGRADATION (LeTID), Conference: 8th SOPHIA Workshop PV-Module Reliability, September 4–5, Ljubljana, Slovenia, 2018

  12. G. Badran, M. Dhimish, Potential Induced Degradation in Photovoltaic Modules: A Review of the Latest Research and Developments, Solar, Vol (3), Pages – (332–346), (2023). [https://doi.org/10.3390/solar3020019]

  13. L. Koester, S. Linding, A. Louwen, A. Astigarraga, G. Manzolini, D. Moser, Review of photovoltaic module degradation, field inspection techniques and techno-economic assessment. Renew. Sustain. Energy Rev. 165 (2022). https://doi.org/10.1016/j.rser.2022.112616]

  14. R. Kopecek, J. Libal, Bifacial Photovoltaics 2021: Status, Opportunities and Challenges, energies, Vol (14), 2021. [https://doi.org/10.3390/en14082076]

  15. D. Chen, M.V. Contreras, A. Ciesla, P. Hamer, B. Hallam, M. Abbott, C. Chan, Progress in the understanding of light- and elevated temperature-induced degradation in silicon solar cells: a review. Progress Photovoltaics. (2020). https://doi.org/10.1002/pip.3362]

    Article  Google Scholar 

  16. M.A. Green, The passivated emitter and rear cell (PERC): From conception to mass production, Solar Energy Materials and Solar Cells, Vol 1(43), PP – 190–197, 2015. [https://doi.org/10.1016/j.solmat.2015.06.055]

  17. R. Chen, H. Tong, H. Zhu, C. Ding, H. Li, D. Chen, B. Hallam, A. Ciesla, C.M. Chong, S. Wenham, 23.83% efficient mono-PERC incorporating advanced hydrogenation. Progress in Photovoltaics: Research and Applications, Vol (12), Pages – 1239–1247, 2020. [https://doi.org/10.1002/pip.3243]

  18. E. Rebekka, K. Wolfram, S. Florian, S. Martin, C. Schubert, W.G. Stefan, Impact of the firing temperature profile on light induced degradation of multi-crystalline silicon. Phys. Status Solidi (RRL). (2016). https://doi.org/10.1002/pssr.201600272]

    Article  Google Scholar 

  19. L. Ning, L. Songb, J. Zhang, Research progress of light and elevated temperature-induced degradation in silicon solar cells: a review. J. Alloys Compd. 912 (2022). https://doi.org/10.1016/j.jallcom.2022.165120]

  20. T. Luka, M. Turek, C. Hagendorf, Defect formation under high temperature dark annealing compared to elevated temperature light soaking. Sol. Energy Mater. Sol. Cells. 187, 194–198 (2018)

    Article  CAS  Google Scholar 

  21. T. Luka, M. Turek, C. Kranert, S. Grober, C. Hagendorf, Microstructural investigation of LID sensitive mc-PERC solar cells, Energy Procedia, Vol (124), Pages 759–766, 2017. [https://doi.org/10.1016/j.egypro.2017.09.080]

  22. T. Niewelt, F. Schindler, W. Kwapil, R. Eberle, J. Schön, M.C. Schubert, Understanding the light-induced degradation at elevated temperatures: similarities between multi-crystalline and float zone p-type silicon. Progress Photovoltaics. (2017). https://doi.org/10.1002/pip.2954]

    Article  Google Scholar 

  23. D. Bredemeier, D.C. Walter, J. Schmidt, Possible candidates for impurities in mc-Si Wafers responsible for Light-Induced Lifetime degradation and regeneration. Sol RRL. (2017). https://doi.org/10.1002/solr.201700159]

    Article  Google Scholar 

  24. M.A. Jensen, A. Zuschlag, S. Wieghold, D. Skorka, A.E. Morishige, G. Hahn, T. Buonassisi, Evaluating root cause: the distinct roles of hydrogen and firing in activating light- and elevated temperature-induced degradation. J. Appl. Phys. 124 (2018). https://doi.org/10.1063/1.5041756]

  25. F. Fertig, K. Krauß, S. Rein, (2015). Light-induced degradation of PECVD aluminium oxide passivated silicon solar cells. physica status solidi (RRL)–Rapid Research Letters, 9(1), Pages (41–46), 2015. [https://doi.org/10.1016/j.egypro.2015.07.086]

  26. F. Kersten, P. Engelhart, H.C. Ploigt, A. Stekolnikov, T. Lindner, F. Stenzel, F. Müller, Degradation of multicrystalline silicon solar cells and modules after illumination at elevated temperature. Sol. Energy Mater. Sol. Cells. 182 (2015). https://doi.org/10.1016/j.solmat.2015.06.015]

  27. K. Nakayashiki, J. Hofstetter, A.E. Morishige, T.T.A. Li, D.B. Needleman, M.A. Jensen, T. Buonassisi, Engineering solutions and root-cause analysis for light-induced degradation in p-type multicrystalline silicon PERC modules. IEEE J. Photovolt. 4 (2016). https://doi.org/10.1109/JPHOTOV.2016.2556981]

  28. E. Fokuhl, T. Naeem, A. Schmid, P. Gebhardt, T. Geipel, D. Philipp, LeTID—a comparison of test methods on module level In 36th European PV Solar Energy Conference and Exhibition Vol. (36), 2019

  29. H. Ge, X. Li, C. Guo, W. Luo, R. Jia, The mechanism of hot spots caused by Avalanche Breakdown. Gallium–Doped PERC Solar Cells Energies. 16 (2023). https://doi.org/10.3390/en16062699]

  30. Editorial, Desk, Gallium-doped Monocrystalline silicon – Best Solution for LeTID and LID in PERC Cells (SOLARQUARTER ENGAGING. ENRICHING, 2020)

  31. F. Kersten, F. Fertig, K. Petter, System performance loss due to LeTID, Energy Procedia, Vol (124), Pages – (540–546), 2017. [doi - https://doi.org/10.1016/j.egypro.2017.09.260]

  32. S. Cheng, F. Ji, C. Zhou, J. Zhu, R. Sondena, W. Wang, D. Hu, Kinetics of light and elevated temperature-induced degradation in cast mono p-type silicon. J. Sol Energy. 224 (2021). https://doi.org/10.1016/j.solener.2021.06.054]

  33. E. Fokuhl, T. Naeem, A. Schmid, P. Gebhardt, T. Geipel, D. Philipp,, LETID - A COMPARISON OF TEST METHODS ON MODULE LEVEL, Presented at the 36th European PV Solar Energy Conference and Exhibition, Marseille, France, 9–13 September 2019

Download references

Acknowledgements

This research was supported by grants from the New and Renewable Energy Technology Development Program of the Korea Institute of Energy Technology Evaluation and Planning (KETEP) funded by the Korean Ministry of Trade, Industry, and Energy (MOTIE) (Project No. 20218520010100 and 20203040010320).

Author information

Authors and Affiliations

Authors

Corresponding authors

Correspondence to Suresh Kumar Dhungel or Junsin Yi.

Additional information

Publisher’s Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Jony, J.A., Yousuf, H., Zahid, M.A. et al. The Mechanics of Light Elevated Temperature Induced Degradation (LeTID) on PERC Module: A Review. Trans. Electr. Electron. Mater. (2024). https://doi.org/10.1007/s42341-024-00526-3

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • DOI: https://doi.org/10.1007/s42341-024-00526-3

Keywords

Navigation