Abstract
This paper addresses the estimation and optimization problems for a step-stress accelerated degradation test (SSADT) when a product’s degradation follows an inverse Gaussian (IG) process. Developing a link model to connect the deterioration measurements at different stress levels is a primary concern for this design issue. In this paper, we propose a tampered degradation model and construct a new framework to model the effect of changing stress from a level to another on the degradation path. Parameter estimates are obtained by both maximum likelihood and Bayesian methods. Under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal settings such as sample size, measurement frequency, and the number of measurements at each stress level are obtained. Finally, a real-world example is analyzed to illustrate the application of the proposed method. A notable finding was that enlarging the difference between the two stress levels makes the test more efficient.
Similar content being viewed by others
Data Availibility Statement
Datasets published in the Yang, G. (2007). Life cycle reliability engineering. John Wiley & Sons.
References
Azizi F, Haghighi F, Ghadiri E, Torabi L (2017) Statistical inference for masked interval data with Weibull distribution under simple step-stress test and tampered failure rate model. Proc Inst Mech Eng Part O J Risk Reliab 231(6):654–665
Bae SJ, Kuo W, Kvam PH (2007) Degradation models and implied lifetime distributions. Reliab Eng Syst Saf 92(5):601–608
Bagdonavicius V, Nikulin M (2001) Accelerated life models: modeling and statistical analysis. CRC Press, Boca Raton
Bhattacharyya GK, Soejoeti Z (1989) A tampered failure rate model for step-stress accelerated life test. Commun Stat Theory Methods 18(5):1627–1643
Deep K, Singh KP, Kansal ML, Mohan C (2009) A real coded genetic algorithm for solving integer and mixed integer optimization problems. Appl Math Comput 212(2):505–518
DeGroot MH, Goel PK (1979) Bayesian estimation and optimal designs in partially accelerated life testing. Nav Res Logist Q 26(2):223–235
Doksum KA, Hbyland A (1992) Models for variable-stress accelerated life testing experiments based on wener processes and the inverse gaussian distribution. Technometrics 34(1):74–82
Duan F, Wang G (2018) Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model. J Stat Comput Simul 88(2):305–328
Haghighi F, Bae SJ (2015) Reliability estimation from linear degradation and failure time data with competing risks under a step-stress accelerated degradation test. IEEE Trans Reliab 64(3):960–971
Hao S, Yang J, Berenguer C (2018) Nonlinear step-stress accelerated degradation modelling considering three sources of variability. Reliab Eng Syst Saf 172:207–215
He D, Wang Y, Chang G (2018) Objective Bayesian analysis for the accelerated degradation model based on the inverse Gaussian process. Appl Math Model 61:341–350
Hu CH, Lee MY, Tang J (2015) Optimum step-stress accelerated degradation test for Wiener degradation process under constraints. Eur J Oper Res 241(2):412–421
Johnson NL, Kotz S, Balakrishnan N (1994) Continuous univariate distributions, vol 1. John Wiley & sons, Hoboken
Liao CM, Tseng ST (2006) Optimal design for step-stress accelerated degradation tests. IEEE Trans Reliab 55(1):59–66
Ling MH, Hu XW (2020) Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions. Reliab Eng Syst Saf 193:106630
Lu CJ, Meeker WO (1993) Using degradation measures to estimate a time-to-failure distribution. Technometrics 35(2):161–174
Ma Z, Wang S, Liao H, Zhang C (2019) Engineering-driven performance degradation analysis of hydraulic piston pump based on the inverse Gaussian process. Qual Reliab Eng Int 35(7):2278–2296
Ma Z, Liao H, Ji H, Wang S, Yin F, Nie S (2021) Optimal design of hybrid accelerated test based on the inverse Gaussian process model. Reliab Eng Syst Saf 107509
Meeker WQ, Escobar LA (2014) Statistical methods for reliability data. John Wiley & Sons, Hoboken
Meeker WQ, Escobar LA, Lu CJ (1998) Accelerated degradation tests: modeling and analysis. Technometrics 40(2):89–99
Mosayebi Omshi E, Shemehsavar S (2019) Optimal design for accelerated degradation test based on D-optimality. Iran J Sci Technol Trans A Sci 43(4):1811–1818
Nelson W (1980) Accelerated life testing-step-stress models and data analyses. IEEE Trans Reliab 29(2):103–108
Nelson WB (2009) Accelerated testing: statistical models, test plans, and data analysis, vol 344. John Wiley & Sons, Hoboken
Peng W, Liu Y, Li YF, Zhu SP, Huang HZ (2014) A Bayesian optimal design for degradation tests based on the inverse Gaussian process. J Mech Sci Technol 28(10):3937–3946
Shi Y, Meeker WQ (2011) Bayesian methods for accelerated destructive degradation test planning. IEEE Trans Reliab 61(1):245–253
Sung SI, Yum BJ (2016) Optimal design of step-stress accelerated degradation tests based on the Wiener degradation process. Qual Technol Quant Manag 13(4):367–393
Tsai CC, Tseng ST, Balakrishnan N (2012) Optimal design for degradation tests based on gamma processes with random effects. IEEE Trans Reliab 61(2):604–613
Tseng ST, Wen ZC (2000) Step-stress accelerated degradation analysis for highly reliable products. J Qual Technol 32(3):209–216
Tseng ST, Balakrishnan N, Tsai CC (2009) Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Trans Reliab 58(4):611–618
Wang X, Xu D (2010) An inverse Gaussian process model for degradation data. Technometrics 52(2):188–197
Wang H, Wang GJ, Duan FJ (2016) Planning of step-stress accelerated degradation test based on the inverse Gaussian process. Reliab Eng Syst Saf 154:97–105
Wang Y, Chen X, Tan Y (2017) Optimal design of step-stress accelerated degradation test with multiple stresses and multiple degradation measures. Qual Reliab Eng Int 33(8):1655–1668
Wu JP, Kang R, Li XY (2020) Uncertain accelerated degradation modeling and analysis considering epistemic uncertainties in time and unit dimension. Reliab Eng Syst Saf 201:106967
Yang G (2007) Life cycle reliability engineering. John Wiley & Sons, Hoboken
Yang XS (ed) (2017) Nature-inspired algorithms and applied optimization, vol 744. Springer, Cham
Ye ZS, Chen LP, Tang LC, Xie M (2014) Accelerated degradation test planning using the inverse Gaussian process. IEEE Trans Reliab 63(3):750–763
Zhang C, Lu X, Tan Y, Wang Y (2015) Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing. Reliab Eng Syst Saf 142:369–377
Funding
No funds, grants, or other support was received.
Author information
Authors and Affiliations
Contributions
E. Mosayebi Omshi and F. Azizi contributed to the design and implementation of the research, to the analysis of the results and to the writing of the manuscript.
Corresponding author
Ethics declarations
Ethical statement
I agree with the ethical statement outlined in the guide for authors.
Appendix
Appendix
We know that \(t_j=jf\) for \(j=1, \dots , n\). Taking this into account, the log-likelihood function with parameter set \(\varTheta =(\beta _1, \beta _2,\gamma , q)\) can be rewritten as:
where \(y_{1.}\), \(y_{2.}\), \(y_{1r}\), and \(y_{2r}\) are the observed values of the statistics in (6) and \(\mu _k, \lambda _k\) for \(k=1,2\) are defined in (10) and (11), respectively.
It simply can be driven that:
Then, the expressions of the elements of the Fisher information \(I(\varTheta )\) in (13) are:
By considering \(\varLambda (t)=t^q\), the p-quantile of the lifetime distribution can be rewritten as:
where \(\mu _0\) and \(\lambda _0\) are defined in (10) and (11). Hence, the elements of the vector \(C(\varTheta )'\) can be expressed as:
Rights and permissions
About this article
Cite this article
Omshi, E.M., Azizi, F. Estimation and Optimization for Step-Stress Accelerated Degradation Tests Under an Inverse Gaussian Process with Tampered Degradation Model. Iran J Sci Technol Trans Sci 46, 297–308 (2022). https://doi.org/10.1007/s40995-021-01243-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s40995-021-01243-9