Abstract
Since α-SnS has optically strong anisotropic characteristics, a simple method to determine its crystal orientation is strongly needed in device engineering. In this report, by measuring dielectric function ε = ε1 + iε2 of α-SnS in the 1–5 eV spectral region with the full azimuthal angle range, we could find a simple relationship between measured dielectric function values and the orientation of the α-SnS crystal axis. Therefore, during the device manufacturing process, one can use spectroscopic ellipsometry to quickly measure the dielectric response of the α-SnS region of the device to correctly orient the SnS along the preferred direction for the best performance of the device. We also performed the azimuthal angle-dependent analysis of the critical points (CP) analysis, which shows that the positions of CP energies are basically invariant, while their amplitudes and lineshapes strongly depend on the azimuthal angle.
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Acknowledgements
This research was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIP) (NRF-2020R1A2C1009041, NRF-2021R1A2C1005359, and NRF-2020R1A5A1016518).
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Nguyen, X.A., Jung, Y.W., Kim, Y.D. et al. Azimuthal angle dependent dielectric function of SnS by ellipsometry. J. Korean Phys. Soc. 80, 59–62 (2022). https://doi.org/10.1007/s40042-021-00364-z
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DOI: https://doi.org/10.1007/s40042-021-00364-z