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Crack density and electrical resistance in indium-tin-oxide/polymer thin films under cyclic loading

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Abstract

Here, we propose a damage model that describes the degradation of the material properties of indium-tin-oxide (ITO) thin films deposited on polymer substrates under cyclic loading. We base this model on our earlier tensile test model and show that the new model is suitable for cyclic loading. After calibration with experimental data, we are able to capture the stress-strain behavior and changes in electrical resistance of ITO thin films. We are also able to predict the crack density using calibrations from our previous model. Finally, we demonstrate the capabilities of our model based on simulations using material properties reported in the literature. Our model is implemented in the commercially available finite element software ABAQUS using a user subroutine UMAT.

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Authors and Affiliations

  1. Computational Solid Mechanics Laboratory (CSML), Division of Physical Sciences and Engineering, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Kingdom of Saudi Arabia

    Angel Mora, Kamran A. Khan & Tamer El Sayed

Authors
  1. Angel Mora
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  2. Kamran A. Khan
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  3. Tamer El Sayed
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Correspondence to Tamer El Sayed.

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Mora, A., Khan, K.A. & El Sayed, T. Crack density and electrical resistance in indium-tin-oxide/polymer thin films under cyclic loading. Electron. Mater. Lett. 10, 1033–1037 (2014). https://doi.org/10.1007/s13391-014-3321-5

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  • DOI: https://doi.org/10.1007/s13391-014-3321-5

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