Abstract
The defects of dislocations and grain boundaries (GBs) could significantly reduce the electrical properties of multicrystalline silicon (mc-Si) solar cells. In this manuscript, the influence of crystal defects on the electrical properties of mc-Si was investigated, aims to carry out the research about the influence of crystal defects on the electrical properties of mc-Si. Purified metallurgical grade N type mc-Si ingot was obtained with the method of vacuum directional solidification technique by employing industrial production ingot furnace. The variations in grain boundaries and dislocations were characterized by electron backscatter diffraction (EBSD), and their effects on the electrical properties of mc-Si before and after annealing at different heat insulating time were investigated. Experimental results showed that high temperature annealing process could significantly improve the electrical properties of mc-Si, the minority carrier lifetime was improved from 0.599 μs to 0.770 μs after 10 h insulation, with a significant increase of 28.61%. Experimental results indicated that high temperature annealing process could significantly eliminate the crystal defects of multicrystalline silicon. The crystal defects was eliminated more obviously with prolonged heat preservation time. When treated by high temperature annealing, the proportion of small angle grain boundaries in the same region can be increased by as high as 13.45%. Moreover, the whole grain sizes of partly region of silicon wafer could be increased by 20000μm2, increased by 15.89% compared with the original grain sizes. Based on the experiment phenomena, we attributed the improvement in the electrical properties of mc-Si to the elimination of dislocations, increased grain sizes and migration of GBs.
Similar content being viewed by others
References
Yang YM, Yu A, Hsu B, Hsu WC, Yang A, Lan CW (2015) Development of highperformance multicrystalline silicon for photovoltaic industry. Prog Photovolt Res Appl 23:340–351
Di Sabatino M, Stokkan G (2013) Defect generation, advanced crystallization, and characterization methods for high-quality soler-cell silicon[J]. Phys Status Solidi A 210:641–648
Mokhtari M, Fujiwara K, Koizumi H et al (2016) Effect of grain boundary grooves at the crystalmelt interface on impurity accumulation during the unidirectional growth of multicrystalline silicon[J]. Scr Mater 117:73–76
Prakash RR, Sekiguchi T, Jiptner K, Miyamura Y, Chen J, Harada H, Kakimoto K (2014) Grain growth of cast-multicrystalline silicon growth from small randomly oriented seed crystal. J Cryst Growth 401:717e719
Prakash RR, Jiptner K, Jun C, Miyamura Y, Harada H, Sekiguchi T (2015) Grain boundary interactions in multicrystalline silicon grown from small randomly oriented seeds[J]. Appl Phys Express 8:035502
Xianjia L, Ronit RP, Jun C et al (2016) Effect of Σ3 generation on random grain boundaries in multicrystalline silicon[J]. Superlattice Microst 99:136–139
Pizzini S, Cagnoni P, Sandrinelli A, Anderle M, Canteri R (1987) Grain boundary segregation of oxygen and carbon in polycrystalline silicon[J]. Appl Phys Lett 51:676
Hartman K, Bertoni M, Serdy J et al (2008) Dislocation density reduction in multicrystalline silicon solar cell material by high temperature annealing[J]. Appl Phys Lett 93(12):122108
Lin HK, Wa MC et al (2016) Evolution of grain structures during directional solidification of silicon wafers[J]. J Cryst Growth 439(2016):40–46
Stoffers A, Cojocaru-Mirédin O et al (2015) Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC and atom probe tomography[J]. Prog Photovoltaics 23:1742–1753
Gao N, Wang SC (2005) A comparison of grain size determination by light microscopy and EBSD analysis[J]. J Mater Sci:0022–2461
Ian Brazil·Martin A. Green. Investigating polysilicon thin film structural changes during rapid thermal annealing of a thin film crystalline silicon on glass solar cell[J]. Mater Sci Mater Electron, 2010,21:994–999
Behm T, Funke C et al (2013) Surface orientation characterisation of rough mc-silicon surface by confocal microscopy and EBSD[J]. Wiley Online Library 45:781–786
Gumbsch P, Riedle J, Hartmaier A, Fischmeister HF (1998) Controlling factors for the brittle-to-ductile transition in tungsten single crystals[J]. Science 282:1293–1295
Takeuchi S, Argon AS (1976) Review: steady-state creep of single-phase crystalline matter at high temperature[J]. J Mater Sci 11:1542–1566
Mittemeijer EJ (2005) Fundamentals of materials science[J]. Springer, Berlin, p 24
Kojima T, Tachibana T, Ohshita Y et al (2015) Origin of recombination activity at small angle grain boundaries in multicrystalline silicon using multi-seed casting growth method[J]. Jpn J Appl Phys 54:08KD16–1–08KD16–4
Sopofi B (2002) Silicon solar-cell processing for minimizing the influence of impurities and defects[J]. J Electron Mater 31(1 0):972–980
Jain T, Lin HK, Lan CW (2018) Three dimensional modelling of grain boundary interaction and evolution during directional solidification of multi-crystalline silicon. J Cryst Growth 485:8–18
Shen H, Gao L et al (2019) Effect of rapid heat treatment on the crystal defect evolution and electrical properties of highly efficient polycrystalline silicon. Silicon. 11:1083–1087
Sopori B, Chen W, Tan T et al (1999) Overcoming the efficiency-limiting mechanisms in commercial Si solar cells[J]. NCPV Photovoltaics Program Review:341–347
Ohshita Y, Nishikawa Y, Tachibana M et al (2005) Effects of defects and impurities on minority carrier lifetime in cast-grown polycrystalline silicon[J]. J Cryst Growth 275:e491–e494
Buonassisi T, Istratov AA, Pickett MD (2006) Metal precipitation at grain boundaries in silicon: dependence on grain boundary character and dislocation decoration[J]. Appl Phys Lett 89:042102
Acknowledgements
The author would like to thank Dr. Liexing Zhou for the support in the EBSD analysis. This research was financially supported by the Program for Innovative Research Team in University of Education of China (No.IRT-17R48). the Reserve Talents of Young and Middle-aged Academic and Technical Leaders in Yunnan Province (2018HB009).
Author information
Authors and Affiliations
Corresponding authors
Additional information
Publisher’s Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Shen, H., Deng, X., Wei, K. et al. Effect of High Temperature Annealing on Crystal Structure and Electrical Properties of Multicrystalline Silicon by the Metallurgical Method. Silicon 12, 2099–2106 (2020). https://doi.org/10.1007/s12633-019-00296-1
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s12633-019-00296-1