Abstract
Interface microstructures of Cu–Ni–Si/Al–Mg–Si clad composite wires during isothermal annealing from 623 to 773 K were investigated. The composite wires were fabricated by a drawing process. The evolution of intermetallic compounds (IMCs) was analyzed. A continuous IMCs layer forms only after annealing for 1 min, which may be due to more IMCs nucleation points generated by deep drawing process. IMCs consist of Al4Cu9, AlCu and Al2Cu identified by energy-dispersive spectroscopy (EDS) and transmission electron microscopy (TEM). The growth activation energies of total IMCs, Al2Cu, AlCu and Al4Cu9, are 98.8, 69.4, 101.3 and 137.1 kJ·mol−1, respectively. The higher growth activation energy of Al4Cu9 results in the higher growth rate under high temperature. However, the average interdiffusion coefficient for each IMC calculated by Wagner method shows that interdiffusion in Al2Cu and AlCu is more active than that in Al4Cu9. The higher growth rate of Al4Cu9 may be caused by the long concentration range.
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This study was financially supported by the National Key Research and Development Plan (No. 2016YFB0301405).
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Yang, Z., Mi, XJ., Feng, X. et al. Interface evolution of Cu–Ni–Si/Al–Mg–Si clad composite wires after annealing. Rare Met. 39, 1419–1424 (2020). https://doi.org/10.1007/s12598-018-1073-3
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DOI: https://doi.org/10.1007/s12598-018-1073-3