Abstract.
This paper reviews the major factors influencing the accuracy of the energy-dispersive X-ray fluorescence (EDXRF) analysis including physical and chemical matrix effects (resulting from particle size, surface irregularity, mineralogy, moisture, absorption and enhancement) as well as the correction procedures with emphasis on the analysis of unprepared samples. Quantification methods for thin samples, samples with intermediate thickness and thick samples are presented including fundamental parameter methods, influence coefficient algorithms, empirical coefficient algorithms and quantification methods based on scattered primary radiation. Quality control procedures are also reviewed.
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References
R Jenkins, R W Gould and D Gedcke, Quantitative X-ray spectrometry, 2nd edn (Marcel Dekker, New York, 1995)
R Tertian and F Claisse, Principles of quantitative X-ray fluorescence analysis (Wiley, New York, 1982)
R E Van Grieken and A A Markowicz (eds) Handbook of X-ray spectrometry, 2nd edn, revised and expanded (Marcel Dekker, New York, Basel, 2002)
A A Markowicz, in: Portable X-ray fluorescence spectrometry – capabilities for in situ analysis edited by P J Potts and M West (RSC Publishing, Cambridge, 2008) p. 13
IUPAC, Commission on Spectrochemical and Other Optical Procedures for Analysis (Analytical Chemistry Division), Nomenclature, symbols, units and their usage in spectrochemical analysis – II, Spectrochim. Acta. B33, 242 (1978)
D Wegrzynek, A Markowicz, E Chinea-Cano and S Bamford, X-Ray Spectrom. 32, 317 (2003)
P F Berry, T Furuta and J R Rhodes, Advances in X-Ray Anal. 12, 612 (1969)
R P Gardner, D Betel and K Verghese, Int. J. Appl. Radiat. Isot. 24, 135 (1973)
P Van Dyck, A Markowicz and R Van Grieken, X-Ray Spectrom. 14, 183 (1985)
B Holynska and A Markowicz, X-Ray Spectrom. 11, 117 (1982)
P J Potts, P C Webb and O Williams-Thorpe, J. Anal. Atomic Spectrom. 12, 769 (1997)
G Liangquan, Z Ye, C Yeshun and L Wangchang, Appl. Radiat. Isot. 49, 1713 (1998)
P Potts, O Williams-Thorpe and P C Webb, J. Geostandards Geoanal. 21, 29 (1997)
S Piorek, in: Current protocols in field analytical chemistry edited by V Lopez-Avila, D Barcelo, W Beckert, S C Goheen, K Jinno, L H Keith and J H Rittenburg (John Wiley & Sons, New York, 1998) Chapter 3, p. 3B1.1
G Liangquan, Y Zhang, Y Cheng, S Zhou, T Xie and S Hou, X-Ray Spectrom. 26, 303 (1997)
A Markowicz, N Haselberger and U Whai Zin Oo, X-Ray Spectrom. 22, 160 (1992)
P Kregsamer, C Streli and P Wobrauschek, in: Handbook of X-ray spectrometry, 2nd edn, revised and expanded, edited by R E Van Grieken and A A Markowicz (Marcel Dekker, New York, Basel, 2002) Chapter 9, p. 582
A A Markowicz and R E Van Grieken, in: Handbook of X-ray spectrometry, 2nd edn, revised and expanded, edited by R E Van Grieken and A A Markowicz (Marcel Dekker, New York, Basel, 2002) Chapter 6, p. 407
A Markowicz and A A Abdunnabi, X-Ray Spectrom. 20, 97 (1991)
R D Giauque, R B Garrett and L Y Goda, Anal. Chem. 51, 511 (1979)
A Markowicz and N Haselberger, Appl. Radiat. Isot. 43, 777 (1992)
D Wegrzynek, B Holynska and T Pilarski, X-Ray Spectrom. 22, 80 (1993)
Austrian Matrix Correction Routine, Description of the program (Technical University of Graz, Austria, 1990)
A Markowicz, N Haselberger, H S El Hassam and M S A Sewando, J. Radioanal. Nucl. Chem. 158, 409 (1992)
D Wegrzynek, A Markowicz and E Chinea-Cano, X-Ray Spectrom. 32, 119 (2003)
A A Markowicz, in: Handbook of X-ray spectrometry, 2nd edn, revised and expanded, edited by R E Van Grieken and A A Markowicz (Marcel Dekker, New York, Basel, 2002) Chapter 1, p. 33
J L de Vries and B A R Vrebos, in: Handbook of X-ray spectrometry, 2nd edn, revised and expanded, edited by R E Van Grieken and A A Markowicz (Marcel Dekker, New York, Basel, 2002) Chapter 5, p. 341
A Markowicz, X-Ray Spectrom. 13, 166 (1984)
J Kikkert, Adv. X-Ray Anal. 26, 401 (1983)
L G Livingstone, X-Ray Spectrom. 11, 89 (1082)
F He and P J Van Espen, Anal. Chem. 63, 2247 (1991)
T Shiraiwa and N Fujino, Jpn J. Appl. Phys. 5, 886 (1966)
J W Criss and L S Birks, Anal. Chem. 40, 1080 (1968)
R M Rousseau, The Rigaku J. 18, 8 (2001)
R Padilla Alvarez, A Markowicz, D Wegrzynek, E Chinea-Cano and S A Bamford, X-Ray Spectrom. 36, 27 (2007)
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MARKOWICZ, A. An overview of quantification methods in energy-dispersive X-ray fluorescence analysis. Pramana - J Phys 76, 321–329 (2011). https://doi.org/10.1007/s12043-011-0045-z
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DOI: https://doi.org/10.1007/s12043-011-0045-z