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Accuracy of the emission-transmission method applied in XRF analysis of intermediate thickness samples

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Abstract

Problems connected with quantitative EDXRF analysis of intermediate thickness samples are addressed. The first one is a systematic study of the various contributions to the total error of the E-T method. Special attention is also given to the enhancement effect for intermediate thickness samples; in this context both monochromatic and bichromatic approaches are adapted to a known theoretical model.

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Author notes

  1. A. Markowicz

    Present address: Institute of Physics and Nuclear Techniques, Academy of Mining and Metallurgy, Al. Mickiewicza 30, Pl-30-059, Cracow, Poland

  2. H. S. El Hassan

    Present address: Department of Physics, University of Khartoum, P.O. Box 321, Khartoum, Sudan

  3. M. S. A. Sewando

    Present address: Department of Physics, University of DSM, P.O. Box 35063, Dar-Es-Salaam, Tanzania

Authors and Affiliations

  1. Agency's Laboratories, IAEA, A-2444, Seibersdorf, (Austria)

    A. Markowicz, N. Haselberger, H. S. El Hassan & M. S. A. Sewando

Authors
  1. A. Markowicz
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  2. N. Haselberger
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  3. H. S. El Hassan
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  4. M. S. A. Sewando
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Markowicz, A., Haselberger, N., El Hassan, H.S. et al. Accuracy of the emission-transmission method applied in XRF analysis of intermediate thickness samples. Journal of Radioanalytical and Nuclear Chemistry, Articles 158, 409–415 (1992). https://doi.org/10.1007/BF02047126

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  • DOI: https://doi.org/10.1007/BF02047126

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