Abstract
Focused ion beam machining revolutionized the way samples are studied in materials science. The introduction of this tool enabled researchers to break into new frontiers of research. While this method focused on the nanometer length scale, the mesoscale manufacturing of samples has not seen such advances. It remains a challenge to manufacture sample geometries too large for focused ion beam milling yet too small for conventional machining. Femtosecond laser ablation opens this length scale of sample space and allows the fabrication of numerous useful geometries. This paper outlines a state-of-the-art femtosecond laser machining system that can be used for rapid, micro- and mesoscale sample preparation. To illustrate the utility of this system, stress–strain data are presented for single-crystal Cu micropillars and three microscale tensile test specimens prepared from physical-vapor-deposited Cu and Ni foils.
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Acknowledgements
The authors acknowledge the support of the US Department of Energy, Office of Nuclear Energy Fuel Cycle Research and Development Program, and the Los Alamos National Laboratory (LANL)/Laboratory Directed Research and Development (LDRD) Program. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the US Department of Energy (DOE) Office of Science. Los Alamos National Laboratory, an affirmative action equal opportunity employer, is operated by Triad National Security, LLC, for the National Nuclear Security Administration of the US DOE under Contract DE-AC52-06NA25396. The authors wish to acknowledge and thank the Center for Integrated Nanotechnology for providing the infrastructure for this work and development. Further, the authors would like to acknowledge the DOE-NEUP Program # DE-NE0008767 and the DOE NEUP infrastructure program for providing the resources for this research.
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McCulloch, Q., Gigax, J.G. & Hosemann, P. Femtosecond Laser Ablation for Mesoscale Specimen Evaluation. JOM 72, 1694–1702 (2020). https://doi.org/10.1007/s11837-020-04045-3
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DOI: https://doi.org/10.1007/s11837-020-04045-3