Abstract
The influence of processing on filled-polymeric bondline microstructure and thermal performance was examined. Cu/thermal interface material/Cu trilayers were assembled with a viscously applied, adhesive thermal interface material with Ag filler particles. It was found that decreasing the squeeze rate used for bondline formation from 10 to 0.1 µm/s resulted in a change in the microstructure from fairly homogeneous (homogeneous at 50 µm length scales and above) to one with marked segregation of many filler particles into highly compacted structures spanning the bondline thickness. A three-fold increase in effective thermal conductivity was correlated with this microstructure change. Significant changes in microstructure resulted when the compressive force (300N) used to form the bondline was removed before the bondline structure was stabilized by a cure operation and a four fold increase in the thermal resistance of such bondlines was observed.
Similar content being viewed by others
References
N.D. Hoivik and R. Linderman, “Method of Obtaining Enhanced Localized Thermal Interface Regions by Particle Stacking,” U.S. patent 7,876,565 (25 January 2011).
N.D. Hoivik and R. Linderman, “Method of Obtaining Enhanced Localized Thermal Interface Regions by Particle Stacking,” U.S. patent 7,394,657 (1 July 2008).
R. Prasher, Proc. IEEE, 94(8) (2006), pp. 1571–1586.
J. Zheng, V. Jadhav, J. Wakil, J. Coffin, S. Iruvanti, R. Langlois, E. Yarmchuk, M. Gaynes, H. Liu, K. Sikka, and P. Brofman, Proc. Electronic Components and Technology Conference, 2009. ECTC 2009 (Piscataway, NJ: IEEE, 2009), pp. 469–474.
D.F. Rae, M.J. Rightley, J.A. Emerson, J.A. Galloway, D.L. Huber, E.J. Cotts, and M.A. Thermitus, Thermal Conductivity 28/ Thermal Expansion 16, ed. R.B. Dinwiddie, M.A. White, and D.L. McElroy (Lancaster, PA: DEStech Publications, 2006), pp. 423–434.
D.F. Rae, E.J. Cotts, and P. Borgesen, Proc. IPC APEX Exposition 2009 (Bannockburn, IL: Association Connecting Electronics Industries, 2009), pp. 1–16.
R. Linderman, T. Brunschwiler, U. Kloter, H. Toy, and B. Michel, Twenty-Third Annual IEEE Semiconductor Thermal Measurement an Management Symp. Proceedings—SEMI-THERM 2007 (Piscataway, NJ: IEEE, 2007), pp. 87–94.
B. Smith, A. Bonetti, T. Gnos, and B. Michel, Twenty-Fifth Annual IEEE Semiconductor Thermal Measurement an Management Symp. Proceedings-SEMI-THERM 2009 (Piscataway, NJ: IEEE, 2009), pp. 304–308.
N. Delhaye, A. Poitou, and M. Chaouche, J. Non-Newtonian Fluid Mechanics, 94 (2000), pp. 67–74.
F. Chaari, G. Racineux, A. Poitou, and M. Chaouche, Rheologica Acta, 42 (2003), pp. 273–279.
J. Collomb, F. Chaari, and M. Chaouche, J. Rheology, 48 (2004), pp. 405–416.
J. Engmann, C. Servais, and A. Burbidge, J. Non-Newtonian Fluid Mechanics, 132 2005), pp. 1–27.
ASTM E 1461, 2007, “Standard Test Method for Thermal Diffusivity of Solids by the Flash Method” (West Conshohocken, PA: ASTM International, 2007), DOI: 10.1520/E1461-07.
H.J. Lee, “Thermal Diffusivity in Layered and Dispersed Composites” (Ph.D. dissertation, Purdue University, West Lafayette, IN, 1975).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Rae, D.F., Borgesen, P. & Cotts, E.J. The effect of filler-network heterogeneity on thermal resistance of polymeric thermal bondlines. JOM 63, 78–84 (2011). https://doi.org/10.1007/s11837-011-0180-5
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11837-011-0180-5