Skip to main content
SpringerLink
Log in

Materials characterization using high-resolution scanning-electron microscopy and x-ray microanalysis

  • Overview
  • Electron Microscopy
  • Published:
JOM Aims and scope Submit manuscript

Abstract

Low-voltage field-emission scanning-electron microscopy offers the possibility to characterize a wide range of materials. Electron optics in an electron beam column have improved in recent decades and now probe diameters of 1–10 nm can be obtained, allowing a wide range of applications to be explored. This article discusses the applications of low-voltage microscopy, including the characterization of nanoparticles, super-lattice structures, and carbon nanotubes.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. D. C. Joy, “The Theory and Practice of High-Resolution Scanning Electron Microscopy,” Ultramicroscopy 37 (1991), pp. 216–233.

    Article  Google Scholar 

  2. D. C. Joy and C. S. Joy, “Low Voltage Scanning Electron Microscopy,” Micron, 27 (1996), pp. 247–263.

    Article  Google Scholar 

  3. P. Hovington, D. Drouin, and R. Gauvin, “Casino: A New Era of Monte Carlo Code in C Language for Electron Beam Interaction. Part I: Description of the Program,” Scanning, 19 (1) (1997), pp. 1–14; Casino can be downloaded at www.montecarlomodeling. mcgill.ca.

    Article  CAS  Google Scholar 

  4. D. C. Joy, C. S. Joy, and R. D. Bunn, “Measuring the Performance of Scanning Electron Microscope Detectors”, Scanning 18 (6) (1996), pp. 553–538.

    Google Scholar 

  5. E. D. Boyes, “On Low Voltage Scanning Electron Microscopy and Chemical Microanalysis,” Microscopy and Microanalysis 6 (2000), pp. 307–316.

    CAS  Google Scholar 

  6. D.E. Newbury, “Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy,” J. Research of the National Institute of Standards and Technology, 107 (6) (2002), pp. 605–619.

    CAS  Google Scholar 

  7. J. I. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis (New York: Kluwer Academic, 2003).

    Google Scholar 

  8. P. Homy, R. Gauvin, and E. Lifshin, “An Extension of the Cliff-Lorimer Technique for Quantitative X-Ray Microanalysis in the Field Emission Scanning Electron Microscope”, submitted to Microscopy and Microanalysis (2006).

  9. R. Gauvin et al., “Win X-Ray, A New Monte Carlo Program to Simulate, the Complete EDS X-Ray Spectrum in the SEM,” Microscopy and Microanalysis, 12 (2006), pp. 1–16. Win X-Ray can be downloades at www.montecarlomodeling.mcgill.ca.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Mining, Metals and Materials Engineering at McGill University in Montreal, Quebec, Canada

    Raynald Gauvin, Kevin Robertson, Paula Horny, Adbelbaset M. Elwazri & Steve Yue

Authors
  1. Raynald Gauvin
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Kevin Robertson
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Paula Horny
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Adbelbaset M. Elwazri
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Steve Yue
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Gauvin, R., Robertson, K., Horny, P. et al. Materials characterization using high-resolution scanning-electron microscopy and x-ray microanalysis. JOM 58, 20–26 (2006). https://doi.org/10.1007/s11837-006-0155-0

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11837-006-0155-0

Keywords

Search

Navigation