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Material surface characterization using low-energy electron microscopy and photoemission electron microscopy

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Abstract

We describe a state-of-the-art surface imaging and material characterization facility recently established for advanced structural, morphological, and electronic structure characterization of material surfaces in real time with nanometre spatial resolutions. Here, we discuss the basic principles of operation as well as the technical details of the low-energy electron microscopy cum photoemission electron microscopy (LEEM–PEEM) facility, which is similar to the transmission electron microscopes. We also present some of our experimental results on various material systems along with the demonstration of the high spatial resolution imaging capabilities as well as the availability of various contrast mechanisms that can be well utilized for nanomaterials research.

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References

  1. C B Carter and D B Williams Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry (Springer) (2016)

  2. K Vernon-Parry III-Vs Rev. 13 40 (2000)

    Google Scholar 

  3. E Bauer Surface Microscopy with Low Energy Electrons 23 (Springer) (2014)

  4. L H Veneklasen Rev. Sci. Instrum. 63 5513 (1992)

    Article  ADS  Google Scholar 

  5. E Bauer Rep. Prog. Phys. 57 895 (1994)

    Article  ADS  Google Scholar 

  6. E Bauer Surf. Rev. Lett. 5 1275 (1998)

    Article  ADS  Google Scholar 

  7. R Tromp and M Reuter Ultramicroscopy 50 171 (1993)

    Article  Google Scholar 

  8. W Telieps, M Mundschau and E Bauer Surf. Sci. 225 87 (1990)

    Article  ADS  Google Scholar 

  9. K C Rose, W Engel, F Meißen, A J Patchett, A M Bradshaw and R Imbihl Surf. Rev. Lett. 5 1233 (1998)

    Article  ADS  Google Scholar 

  10. B Li, W Swiech, J Venables and J Zuo Surf. Sci. 569 142 (2004)

    Article  ADS  Google Scholar 

  11. S Agnoli, T O Mentes, M A Nino, A Locatelli and G Granozzi Phys. Chem. Chem. Phys. 11 3727 (2009)

    Article  Google Scholar 

  12. E Bauer J. Electron. Spectros Relat. Phenomena 185 314 (2012)

    Article  Google Scholar 

  13. E Bauer Ultramicroscopy 119 18 (2012)

    Article  Google Scholar 

  14. W Telieps and E Bauer Surf. Sci. 162 163 (1985)

    Article  ADS  Google Scholar 

  15. S R Mohanty, A Kar, B B Jena and K S R Menon AIP Conf. Proc. 2265 030278 (2020)

    Article  Google Scholar 

  16. S R Mohanty, A Kar, S Paul and K S R Menon Indian J. Phys. (2022). https://doi.org/10.1007/s12648-022-02439-4

    Article  Google Scholar 

  17. S R Mohanty, S Paul, A Kar and K S R Menon (unpublished)

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Acknowledgements

We acknowledge the encouragement and support received from different directors of SINP, Kolkata, to realize the project. This facility was funded by the Department of Atomic Energy (DAE), Government of India, under the XII-th plan CENSUP-II project (PIC No. XII-R&D- SIN-5.09-0102). SP acknowledges University Grant Commission (UGC), India, for the PhD fellowship. We also thank ELMITEC Elektronenmikroskopie GmbH for the technical support during and after the commission of the instrument.

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  1. Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, A CI of Homi Bhabha National Institute, 1/AF Bidhannagar, Kolkata, 700064, India

    S. R. Mohanty, S. Paul & K. S. R. Menon

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  1. S. R. Mohanty
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  2. S. Paul
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  3. K. S. R. Menon
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Correspondence to K. S. R. Menon.

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Mohanty, S.R., Paul, S. & Menon, K.S.R. Material surface characterization using low-energy electron microscopy and photoemission electron microscopy. Indian J Phys 97, 2395–2404 (2023). https://doi.org/10.1007/s12648-022-02577-9

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  • DOI: https://doi.org/10.1007/s12648-022-02577-9

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