Abstract
Thin films of CdSxTe1−x (0≤x≤ 1) have been prepared by vacuum evaporation from solid solutions. Rutherford backscattering spectrometry has been used to determine the thickness of the films, which is in the range 8–50 nm, and x-ray diffraction analysis has been used to determine the phase. The refractive index and extinction coefficient of the films has been calculated from reflectance and transmittance measurements for the wavelength region 250–3200 nm. Polynomial functions are given for each sample, which describe the variation in refractive index and extinction coefficient over the entire wavelength range. Least squares fitting to the absorption spectra revealed that the films all have a direct band gap, although photon energies required for indirect transitions have also been found. CdS0.8Te0.2 is found to have the lowest absorption coefficient at energies greater than 2.1 eV.
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Wood, D.A., Lane, D.W., Rogers, K.D. et al. Optical properties of CdSxTe1−x polycrystalline thin films. J. Electron. Mater. 28, 1403–1408 (1999). https://doi.org/10.1007/s11664-999-0130-y
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DOI: https://doi.org/10.1007/s11664-999-0130-y