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Preparation, and structural, optical and electrical properties of the CdTe1−xSx system

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Abstract

Thin films of the CdTe1−xSx system (0<x<1) have been prepared by a thermal evaporation technique, and their structural, optical and electrical properties have been measured in order to characterize the system. Detailed X-ray analysis showed that the structures are polycrystalline and the interplanar distances have been calculated for those systems. The CdTe0.4S0.6 system showed a maximum optical absorption. It is observed that the optical gap, Eopt, is indirect for (0<x<0.5) while for (0.6<x<1) it is direct. The variation of Eopt with x in the CdTe1−xSx system is not linear and the minimum value of Eopt, was for x=0.3. The addition of copper dopants up to 3% to the CdTe0.4S0.6 system reduced the value of Eopt. The electrical conductivity showed two values of activation energy indicating different dominant conduction mechanisms in different temperature ranges.

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Authors and Affiliations

  1. Department of Physics, College of Science, University of Baghdad, Jadirya, Baghdad, Iraq

    S. K. J. Al -Ani, M. N. Makadsi & I. K. Al -Shakarchi

  2. Department of Physics, Brunel University, UB8 3PH, Uxbridge, Middlesex, UK

    C. A. Hogarth

Authors
  1. S. K. J. Al -Ani
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  2. M. N. Makadsi
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  3. I. K. Al -Shakarchi
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  4. C. A. Hogarth
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Al -Ani, S.K.J., Makadsi, M.N., Al -Shakarchi, I.K. et al. Preparation, and structural, optical and electrical properties of the CdTe1−xSx system. JOURNAL OF MATERIALS SCIENCE 28, 251–258 (1993). https://doi.org/10.1007/BF00349059

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  • DOI: https://doi.org/10.1007/BF00349059

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