Abstract
The magnetic and photomagnetic properties of polycrystalline Cd1-xMnxTe thin films prepared by radio frequency (rf) sputtering have been investigated. Magnetization measurements were carried out using a rf superconducting quantum interference device magnetometer in the temperature range of 1.8∼300K at various magnetic fields up to 5.5 T. For temperatures above 40K, Curie-Weiss behavior was observed with a negative Weiss constant indicating predominantly antiferromagnetic interactions. Spin-glass transitions occurred at low temperatures. Photoinduced magnetization has been observed when the sample was illuminated by unpolarized light from an optical fiber.
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He, X.F., Kotlicki, A., Dosanjh, P. et al. Magnetic and photomagnetic properties of polycrystalline wide-gap semiconductor Cd1-xMnxTe thin films. J. Electron. Mater. 26, 73–77 (1997). https://doi.org/10.1007/s11664-997-0091-y
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DOI: https://doi.org/10.1007/s11664-997-0091-y