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Journal of Electronic Materials, Vol. 26, No. 9, pp. 1009–1020 (1997).
The online version of the original article can be found at http://dx.doi.org/10.1007/s11664-997-0238-x
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Barmak, K., Rickman, J.M. & Michaelsen, C. Evolution of grain structure in thin film reactions. J. Electron. Mater. 26, 1370 (1997). https://doi.org/10.1007/s11664-997-0087-7
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DOI: https://doi.org/10.1007/s11664-997-0087-7