Abstract
The measurement of electrical resistance, capacitance and impedance is central to the electrical characterization of materials, whether the materials are in bulk, thick film or thin film forms. However, there are numerous common pitfalls in the measurement. The pitfalls mainly relate to the electrode design, electrode configuration and measurement instrument utilization. This commentary provides an overview of these pitfalls, along with the methods of measurement.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of interest
The author declares that she has no conflict of interest.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Chung, D.D.L. Pitfalls and Methods in the Measurement of the Electrical Resistance and Capacitance of Materials. J. Electron. Mater. 50, 6567–6574 (2021). https://doi.org/10.1007/s11664-021-09223-w
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-021-09223-w