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Room-Temperature Gas Sensing Properties of Nanocrystalline-Structured Indium-Substituted Copper Ferrite Thin Film

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Abstract

Nanocrystalline indium-substituted copper ferrite thin film has been prepared by a chemical coprecipitation method and characterized by x-ray diffraction (XRD) analysis, scanning electron microscopy (SEM), transmission electron microscopy (TEM), Fourier-transform infrared (FTIR) spectroscopy, ultraviolet–visible (UV–Vis) spectroscopy, and gas sensing measurements. XRD and SEM analyses revealed heterogeneous particle formation with cubic structure. Fourier-transform infrared (FTIR) spectroscopy revealed normal behavior for ferrite materials. The bandgap of the material was found to lie in the range of 1.54 eV, implying semiconducting nature. Gas sensor analysis revealed excellent sensing behavior at room temperature. The material showed fast detection response for liquefied petroleum gas (LPG) at low concentration, with enhanced sensitivity at increased LPG concentration. The thin-film sensor showed repeatability nature with reproducibility of ∼ 96%.

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Acknowledgement

Monika Singh is grateful to DAE-BRNS, Government of India for financial support in the form of Project Grant Vide Sanction No. 2013/34/27/BRNS/2693.

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Authors and Affiliations

  1. Department of Physics, Kongunadu Arts and Science College, Coimbatore, Tamil Nadu, 641029, India

    V. Manikandan

  2. Nanomaterials and Sensors Research Laboratory, Department of Applied Physics, Babasaheb Bhimrao University, Lucknow, UP, 226025, India

    Monika Singh & B. C. Yadav

  3. Department of Physics, Government College of Technology, Coimbatore, Tamil Nadu, 641013, India

    S. Vigneselvan

Authors
  1. V. Manikandan
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  2. Monika Singh
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  3. B. C. Yadav
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  4. S. Vigneselvan
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Correspondence to V. Manikandan.

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Manikandan, V., Singh, M., Yadav, B.C. et al. Room-Temperature Gas Sensing Properties of Nanocrystalline-Structured Indium-Substituted Copper Ferrite Thin Film. J. Electron. Mater. 47, 6366–6372 (2018). https://doi.org/10.1007/s11664-018-6543-8

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  • DOI: https://doi.org/10.1007/s11664-018-6543-8

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