Abstract
In this work, we investigated the frictional behavior of copper CMP. Using a laboratory polishing set up, we polished Cu with designed polishing media. After that the copper surface and the fumed silica particles Cu were analyzed. The surface analysis techniques used are the field emission SEM, the field-emission high-resolution analytical TEM, x-ray spectroscopy, and XPS. We found evident difference in friction value using different polishing media. Discussions lead to three mechanisms during copper CMP. The nature of copper oxides has a profound influence on friction and might be directly related to defects.
Similar content being viewed by others
References
J. Larsen-Basse and H. Liang, Wear, 233–235, 647 (1999).
F.B. Kaufman, D.B. Thompson, R.E. Broadie, M.A. Jaso, W.L. Gutherie, D.J. Pearson, and M.B. Small, J. Electrochem. Soc. 138, 3460 (1991).
D. Stein, D. Hetherington, T. Guilinger, and J. Cecchi, J. Eletrochem. Soc., 145, 3190 (1998).
J.M. Martin, Th. Le Mogne, C. Grossiord, and Th. Palermo, Trib. Lett. 3, 87 (1997).
J.M. Martin, Trib. Lett., 6, 1 (1999).
J.T. Dickinson, N.-S. Park, M-W. Kim, and S.C. Langford, Trib. Lett. 3, 69 (1997).
O. Kubaschewaki, and B.E. Hopkins, Oxidation of Metals and Alloys (London: Butterworths, 1953).
M. Pourbaix, Atlas of Electrochemical Equilibria in Aqueous Solutions, (Houston, TX: NACE, 1975).
J.M. Steigerwald, S.P. Murarka, and R.J. Gutmann, Proc. MRS Symp. Spring, 55 (1995).
V. Brusic, M.A. Frisch, B.N. Eldridge, F.P. Novak, F.B. Kaufman, B.M. Rush, and G.S. Frankel, J. Electrochem. Soc. 138, 2253 (1991).
G.S. Braely and H.R. Clauser, Materials Handbook, 3rd edition, (New York: McGraw-Hill, Inc., 1991).
C.T. Lynch, CRC Handbook of Materials Science, Vol. I, General Properties, (Boca Raton, FL: CRC Press, Inc., 1991).
M. Hoshino, H. Suehiro, K. Kasai, and J. Komeno, Jpn. J. Appl. Phys. 32, L392 (1993).
V. Brusic, D. Scherber, F. Kaufman, R. Kistler, and C. Streinz, Proc. 1st Symp. on CMP in IC Device Manufacturing (Pennington, NJ: Electrochem. Soc., 1996).
C. Streinz, T. Myers, and C. Yu, Proc. 5th Int. Symp. CMP in IC Device Mfg. (Pennington, NJ: Electrochem. Soc., 1996), p. 159).
H. Hirabayashi, M. Higuchi, M. Kinoshita, H. Kaneko, N. Hayasaka, K. Mase, and J. Oshima, Proc. First Int. CMP for VLSI/ULSI Multilevel Interconnection Conf. (CMP-MIC) (1996), p. 22.
CRC Handbook of Chemistry and Physics, 68th Edition (Boca Raton, FL: CRC Press, 1987–1988), p. B-89.
Author information
Authors and Affiliations
Additional information
Argonne National Laboratory
Rights and permissions
About this article
Cite this article
Liang, H., Martin, JM. & Lee, R. Influence of oxides on friction during Cu CMP. J. Electron. Mater. 30, 391–395 (2001). https://doi.org/10.1007/s11664-001-0049-4
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/s11664-001-0049-4