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Microstructure of Equal-Channel Angular Pressed Cu and Cu-Zr Samples Studied by Different Methods

  • Symposium: Neutron and X-Ray Studies of Advanced Materials
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Abstract

Polycrystalline samples of technical-purity Cu (99.95 wt pct) and Cu with 0.18 wt pct Zr have been processed at room temperature by equal-channel angular pressing (ECAP). The microstructure evolution and its fragmentation after ECAP were investigated by transmission electron microscopy (TEM), electron backscattered diffraction (EBSD), positron annihilation spectroscopy (PAS), and by X-ray diffraction (XRD) line-profile analysis. The first two techniques revealed an increase in the fraction of high-angle grain boundaries (HAGBs), with increasing strain reaching the value of 90 pct after eight ECAP passes. The increase was more pronounced for pure Cu samples. The following two kinds of defects were identified in ECAP specimens by PAS: (1) dislocations that represent the dominant kind of defects and (2) small vacancy clusters (so-called microvoids). A detailed XRD line-profile analysis was performed by the analysis of individual peaks and by total profile fitting. A slight increase in the dislocation density with the number of ECAP passes agreed with the PAS results. Variations in microstructural features obtained by TEM and EBSD can be related to the changes in the XRD line-broadening anisotropy and dislocation-correlation parameter.

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Notes

  1. JEOL is a trademark of Japan Electron Optics Ltd., Tokyo.

  2. Struers is a trademark of Struers A/S, Ballerup, Denmark.

  3. Carl Zeiss is a trademark of Carl Zeiss Semiconductor technologies A.G., Jena, Germany.

  4. HKL Oxford Instruments is a trademark of Oxford Instruments Nanoanalysis, Bucks, UK.

  5. HKL Oxford Instruments is a trademark of Oxford Instruments Nanoanalysis, Bucks, UK.

  6. PHILIPS is a trademark of Philips Electronic Instruments Corp., Mahwah, NJ.

  7. Instron is a trademark of Instron Ltd., High Wycombe, UK.

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Acknowledgments

This work was financially supported by the research program MSM 0021620834 of the Ministry of Education of the Czech Republic. One of the authors (OS) acknowledges the financial support provided by the Grant Agency of the Charles University (GAUK) under Grant No. 81108. Partial financial support from the Academy of Sciences of the Czech Republic under Grants Nos. ME08022 and KAN400720701 is also acknowledged.

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Authors and Affiliations

  1. Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University in Prague, 121 16, Prague 2, Czech Republic

    R. Kužel (Associate Professor and Head of Department) & Z. Matěj (Postdoctoral Student)

  2. Department of Physics of Materials, Faculty of Mathematics and Physics, Charles University in Prague, 121 16, Prague 2, Czech Republic

    M. Janeček (Associate Professor and Head of Department) & O. Srba (Postdoctoral Student)

  3. Department of Low Temperature Physics, Faculty of Mathematics and Physics, Charles University in Prague, 121 16, Prague 2, Czech Republic

    J. Čížek (Senior Assistant Professor)

  4. Institute of Materials Science, TU Bergakademie Freiberg, D-09599, Freiberg, Germany

    M. Dopita (Postdoctoral Student)

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  1. R. Kužel
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Correspondence to R. Kužel.

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This article is based on a presentation given in the symposium entitled “Neutron and X-Ray Studies of Advanced Materials” which occurred February 15–19, 2009 during the TMS Annual Meeting in San Francisco, CA, under the auspices of TMS, TMS Structural Materials Division, TMS/ASM Mechanical Behavior of Materials Committee, TMS: Advanced Characterization, Testing, and Simulation Committee, and TMS: Titanium Committee.

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Kužel, R., Janeček, M., Matěj, Z. et al. Microstructure of Equal-Channel Angular Pressed Cu and Cu-Zr Samples Studied by Different Methods. Metall Mater Trans A 41, 1174–1190 (2010). https://doi.org/10.1007/s11661-009-9895-0

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