Abstract
The development of lead-free solders has emerged as one of the key issues in the electronics packaging industries. Bi-Sn-Ag eutectic alloy has been considered as one of the lead-free solder materials that can replace the toxic Pb-Sn eutectic solder without increasing soldering temperature. We investigated the effects of temperature gradient and growth rate on the mechanical, electrical and thermal properties of the Bi-Sn-Ag ternary eutectic alloy. Bi-47 wt%Sn-0.68 wt%Ag alloy was directionally solidified upward with different temperature gradients (G=2.33-5.66 K/mm) at a constant growth rate (V=13.25 μm/s) and with different growth rates (V=6.55-132.83 μm/s) at a constant temperature gradient (G=2.33 K/mm) in the growth apparatus. The microstructures (λ), microhardness (HV), tensile stress (σ), electrical resistivity (ρ), and thermal properties (ΔH, C p, T m) were measured on directionally solidified samples. The dependency of the λ, HV, σ, and ρ on G and V was investigated. According to the experimental results, λ values decrease with increasing G and V, but HV, λ, and ρ values increase with increasing G and V. Variations of electrical resistivity (ρ) for cast samples with the temperature in the range of 300-400 K were also measured by using a standard dc four-point probe technique. The enthalpy of fusion (ΔH) and specific heat (C p) for the same alloy was also determined by means of differential scanning calorimeter (DSC) from heating trace during the transformation from eutectic liquid to eutectic solid.
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References
Deng X, Sidhu RS, Johnson P, et al. Influence of Reflow and Thermal Aging on the Shear Strength and Fracture Behavior of Sn-3.5Ag Solder/Cu Joints[J]. Metallurgical and Materials Transactions A, 2005, 36(1): 55–64
He M, Chen Z, Qi GJ. Mechanical Strength of Thermal Aged Sn-3.5Ag/Ni-P Solder Joints[J]. Metallurgical and Materials Transactions A, 2005, 36A: 65–75
Kamal M, El Said Gouda, Marei L K. Effect of Bi-Content on Hardness and Micro-Creep Behavior of Sn-3.5Ag Rapidly Solidified Alloy[J]. Crystal Reseasch and Technology, 2009, 44(12): 1308–1312
Arenas M F, Acoff V L. Contact Angle Measurements of Sn-Ag and Sn-Cu Lead-Free Solders on Copper Substrate[J]. Journal of Electronic Materials, 2004, 33: 1452–1458
Arenas M F, He M, Acoff V L. Effect of Flux on the Wetting Characteristics of SnAg, SnCu, SnAgBi, and SnAgCu Lead-Free Solders on Copper Substrates[J]. Journal of Electronic Materials, 2006, 35: 1530–1536
Çadırlı E, Kaya H, Maraşlı N, et al. The Effect of Growth Rate on Microstructure and Microindentation Hardness in the In-Bi-Sn Ternary Alloy at Low Melting Point[J]. Journal of Alloys and Compounds, 2009, 470,150-156
Smiths M. Masurement of Sheet Resistivities with the Four-Point Probe[J]. The Bell System Techonology, 1958, 37: 711
Aker A, Kaya H. Measurements of Microstructural, Mechanical, Electrical, and Thermal Properties of an Al–Ni Alloy[J]. International Journal of Thermophys, 2013, 34: 267–283
Aresa A E, Gueijmanb S F, Caramc R, et al. Analysis of Solidification Parameters During Solidification of Lead and Aluminum Base Alloys[J]. Journal of Crystal Growth, 2005, 275(1): 319–327
Aker A, Engin S, Kaya H. Influence of the Growth Rate on Physical Properties in the Aluminum-Antimony Eutectic Alloy[J]. International Journal of Materials Engineering and Technology, 2013, 9(1): 59–76
Sahin M, Cadırlı E, Kaya H. Influence of the Solidification Parameters on Dendritic Microstructures in Unsteady-State Directionally Solidificationof Lead-Antimony Alloy[J]. Surface Review Letters, 2010, 17: 477
Cadırlı E, Kaya H. Dendritic Growth of the Binary Succinonitrile-Camphor System[J]. Surface Review Letters. 2007, 14: 1169
Jackson K A, Hunt J D. Hunt, Lamellar and Rod Eutectic Growth[J]. Transation Metalliars Society A.I.M.E., 1966, 236: 1129
De Wilde J, Froyen L, Rex S. Coupled Two-Phase [alpha(Al)+theta(Al2Cu)] Planar Growth and Destabilisation Along the Univariant Eutectic Reaction in Al-Cu-Ag Alloys[J]. Scripta Materialia, 2004, 51: 533–538
Witusiewicz VT, Hecht U, Rex S, et al. In Situ Observation of Microstructure Evolution in Low-Melting Bi-In-Sn Alloys by Light Microscopy[J]. Acta Materialia, 2005, 53: 3663–3669
Kaya H, Çadırlı E, Böyük U, et al. Variation of Microindentation Hardness with Solidification and Microstructure Parameters in the Al Based Alloys[J]. Applied Surface Science, 2008, 255(5): 3071–3078
Khan S, Ourdjini A, Hamed Q S, et al. Hardness and Mechanical Property Relationship in Directionally Solidified Aluminium-Silicon Eutectic Alloys with Different Silicon Morphologies[J]. Journal of Materials Science, 1993, 28: 5957–5962
Kaya H, Böyük U, Engin S, et al. Measurements of the Microhardness and Thermal and Electrical Properties of the Binary Zn-0.7 wt%Cu Hypoperitectic Alloy[J]. Journal of Electronic Materials, 2010, 39(3): 303–311
Kaya H, Böyük U, Cadırlı E, et al. Measurements of the Microhardness, Electrical and Thermal Properties of the Al–Ni Eutectic Alloy[J]. Materials Design, 2012, 34: 707–712
Sergeev A, Mitin V. Electron-Phonon Interaction in Disordered Conductors: Static and Vibrating Scattering Potentials[J]. Physical Review B, 2000, 61, 6041–6047
Boekelheide Z, Cooke D W, Helgren E, et al. Resonant Impurity Scattering and Electron-Phonon Scattering in the Electrical Resistivity of Cr Thin Films[J]. Physical Review B, 2009, 80134426–80134438
Rudnev V, Loveless D, Cook R, et al. Handbook of Induction Heating[M]. New York: Markel Dekker Inc. 2003
Hultgren R, Desai P D, Hawkins D T, et al. Selected Values of the Thermodynamic Properties of the Elements[G]. American Society for Metals, OH, USA, 1973
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Supported by the Erciyes University Scientific Research Project Unit (No. FBA-10-3376)
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Kaya, H., Engin, S., Aker, A. et al. Microstructural, mechanical, electrical, and thermal properties of the Bi-Sn-Ag ternary eutectic alloy. J. Wuhan Univ. Technol.-Mat. Sci. Edit. 32, 147–154 (2017). https://doi.org/10.1007/s11595-017-1573-2
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DOI: https://doi.org/10.1007/s11595-017-1573-2