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Surface bonding on silicon surfaces as probed by tip-enhanced Raman spectroscopy

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Abstract

Tip-enhanced Raman spectroscopy (TERS) has been used to obtain the Raman signal of surface species on silicon single crystal surfaces without the necessity for surface enhancement by addition of Ag nanoparticles. By illuminating the hydrogenterminated silicon surface covered with a droplet of 4-vinylpyridine with UV light, a 4-ethylpyridine modified silicon surface can be easily obtained. By bringing a scanning tunneling microscope (STM) Au tip with a nanoscale tip apex to a distance of ca. 1 nm from the modified silicon surface, enhanced Raman signals of the silicon phonon vibrations and the surface-bonded 4-ethylpyridine were obtained. The Raman enhancement factor was estimated to be close to 107. By comparing the surface-enhanced Raman scattering (SERS) signal obtained after surface enhancement with Ag nanoparticles and the TERS signal of the surface, the advantage of TERS over SERS for characterizing the surface species on substrates becomes apparent: TERS readily affords vibrational information about the system without disturbing it by surface enhancement. In this sense, TERS can be considered a truly non-invasive tool which is ideal for characterizing the actual surface species on substrates.

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Authors and Affiliations

  1. State Key Laboratory of Physical Chemistry of Solid Surfaces and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China

    MuDe Zhuang, Zheng Liu, Bin Ren & ZhongQun Tian

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  1. MuDe Zhuang
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  2. Zheng Liu
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  3. Bin Ren
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  4. ZhongQun Tian
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Correspondence to Bin Ren.

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Zhuang, M., Liu, Z., Ren, B. et al. Surface bonding on silicon surfaces as probed by tip-enhanced Raman spectroscopy. Sci. China Chem. 53, 426–431 (2010). https://doi.org/10.1007/s11426-010-0068-1

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