Abstract
To estimate stresses near specimen surfaces, X-ray diffraction (XRD) is applied to titanium alloys. Some of these alloys are difficult to study since they are composed of various phases of different proportions, shapes and scales. For millimetric probed volumes, such multi-phase microstructures induce shallow and noisy diffraction signals. Two peak registration techniques are introduced and validated thanks to tensile tests performed on two titanium alloy samples.
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Notes
The resolution of a measuring system is the “smallest change in a quantity being measured that causes a perceptible change in the corresponding indication” [48].
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Acknowledgements
This work was funded by Safran Landing Systems. The authors acknowledge Pierre Mella for providing Ti64 alloy and useful discussions on XRD analyses. The authors also thank Adam Cox for providing Ti5553 alloy samples and Thierry Bergey for electropolishing them.
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Voillot, B., Lebrun, JL., Billardon, R. et al. Validation of Registration Techniques Applied to XRD Signals for Stress Evaluations in Titanium Alloys. Exp Mech 58, 1265–1280 (2018). https://doi.org/10.1007/s11340-018-0391-6
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DOI: https://doi.org/10.1007/s11340-018-0391-6