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Distortion Correction Protocol for Digital Image Correlation after Scanning Electron Microscopy: Emphasis on Long Duration and Ex-Situ Experiments

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Abstract

Recently, scanning electron microscopy (SEM) has been used for digital image correlation (DIC), as micrographs can be acquired with high magnification, providing improved resolution to quantify strain heterogeneities. However, it has been shown by researchers that SEM images can be problematic due to inherent electromagnetic distortions that are not present in optical images. Drift, spatial distortions, and magnification uncertainties are the main issues that can seriously affect the accuracy of localized strain measurements. The present work focuses on long duration experiments, for which images are taken days or weeks apart. We have proposed a systematic procedure to reduce drift, correct spatial distortion, and account for magnification variations between pairs of acquired images. Additionally, SEM parameters are discussed and chosen to increase the signal-to-noise ratio and improve the accuracy of the DIC measurements. The spatial distortion correction increases the repeatability of the correlated values and the precision of the measurements. The implementation for this type of correction is done by applying the measured distortion gradient of a certified grid onto the DIC strain field. The magnification adjustment increases the reliability of the strain maps, ensuring the measurements are in agreement with the actual strain induced during the experiment. We have presented a systematic protocol for ex-situ DIC experiments within the SEM and some basic cross-check procedures that can be performed to evaluate the reliability of the reference grid and the precision of the final strain map.

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Acknowledgements

Support for this work was provided by Rolls-Royce Corporation, DARPA (N66001-14-1-4041), the National Science Foundation (CMMI 13-34664), and the Office of Naval Research, (N00014-14-1-0544). The authors would like to thank: John Rotella from Purdue’s ACME2 group for his help on processing the images; Jan Eberle from Purdue for his help in better understanding the principles of SEM; and Professor Samantha Daly from the University of California at Santa Barbara for discussions on this topic. All electron microscopy was performed with the help of staff in the Life Science Microscopy Facility, Purdue University.

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Authors and Affiliations

  1. School of Aeronautics and Astronautics, Purdue University, 701 W. Stadium Ave, West Lafayette, IN, 47907, USA

    A. W. Mello, T. A. Book, A. Nicolas, S. E. Otto & M. D. Sangid

  2. Life Science Microscopy Facility, Purdue University, 170 S. University St, West Lafayette, IN, 47907, USA

    C. J. Gilpin

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  1. A. W. Mello
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  2. T. A. Book
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  3. A. Nicolas
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  4. S. E. Otto
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  6. M. D. Sangid
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Correspondence to M. D. Sangid.

Appendix

Appendix

This paper provides a systematical protocol for distortion corrections (due to inherent electromagnetic spatial distortion or inaccurate displayed magnification values). The aforementioned procedures were developed for long duration, ex-situ experiments, in which the referenced and strained images are taken in separate SEM sessions and to minimize spatial distortion in SEM systems in which the xyz translational position stage has low resolution. To ensure this procedure is repeatable and easy to implement by future users, Table 1 provides a concise summary of the distortion correction protocol.

Table 1 Summary guideline for the bias correction of SEM-DIC
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Mello, A.W., Book, T.A., Nicolas, A. et al. Distortion Correction Protocol for Digital Image Correlation after Scanning Electron Microscopy: Emphasis on Long Duration and Ex-Situ Experiments. Exp Mech 57, 1395–1409 (2017). https://doi.org/10.1007/s11340-017-0303-1

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