Abstract
A compact, phase-multiplied, circular polariscope and series interferometer arrangement is developed for high-resolution, full-field stress measurement in single crystals with weak piezo-optical coefficients. We present a general stress-optic law, derived from anisotropic piezo-optical constitutive relations, which provides the theoretical framework for obtaining stress field components from measured optical isoclinic, isochromatic and isopachic phase maps. A new phase image processing technique is also developed, which combines data obtained from different interference configurations for the successful removal of low-modulation zones within isoclinic and isopachic phase maps. The validity and accuracy of the proposed interferometer arrangement and stress measurement methodology are demonstrated through a compression test of a c-cut single crystal sapphire plate loaded by a cylindrical indenter.
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Acknowledgments
Xia SM gratefully acknowledges the support of the National Science Foundation (DMR # 0520565) through the Center for Science and Engineering of Materials (CSEM) at the California Institute of Technology. The authors also thank Prof. Guruswami Ravichandran and Prof. Kaushik Bhattacharya at the California Institute of Technology for extremely helpful and insightful discussions.
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Appendix: Jones Calculus of Bright- and Dark-field Interferometry
Appendix: Jones Calculus of Bright- and Dark-field Interferometry
In the optical arrangement as shown in Fig. 2(a), the input light beam becomes right-circularly polarized after it passes through the horizontal linear polarizer and the λ/4 plate whose fast axis is aligned at 45o with respect to the positive x-axis. The normalized Jones vector of the right-circular light is given by
The Jones matrix of the birefringent specimen plate is written as
in which δ 1 and δ 2 are the two principal retardations and θ is the orientation of δ 1 with respect to the positive x-axis.
According to the Jones calculus, the Jones vector of the first-order reference beam emerging from the specimen is a 1 = Ra. For the (2m+3)-th order measurement beam, it travels through the plate for (2m+3) times. Therefore, its Jones vector is given by \( {\mathbf{a}}_{{2{\text{m}} + 3}} = {\mathbf{R}}^{{2{\text{m}} + 3}} {\mathbf{a}} \). The Jones vector of coherent combination of the reference and measurement beams is expressed by
For the configurations of bright- and dark-field interferometry, the Jones vectors of the light beams that emerge from the output λ/4 plate and analyzer are given by
and
respectively. The light intensities of the two beams are calculated as \( {I_{\text{Bright}}} = \widetilde{a}\prime \prime a\prime \prime \) and \( {I_{\text{Dark}}} = \widetilde{a}\prime \prime \prime a\prime \prime \prime \), where the tilde notation denotes the transpose complex conjugate operation. Substitution of equations (A1)–(A5) into the two intensity equations and subsequent simplification lead to
and
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Xia, S., Mello, M. Phase-Multiplied Photoelastic and Series Interferometer Arrangement for Full-Field Stress Measurement in Single Crystals. Exp Mech 51, 653–666 (2011). https://doi.org/10.1007/s11340-010-9448-x
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DOI: https://doi.org/10.1007/s11340-010-9448-x