Abstract
Atomic-force microscopy, reflectometry, and ellipsometry were applied to analysis of ultrathin films (3.3–13.6 nm) of a rigid-chain polyimide, formed on the surface of a silicon substrate by thermal imidization of Langmuir-Blodgett films of polyamido acid derived from 3,3′,4,4′-diphenyltetracarboxylic acid and ortho-tolidine.
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Translated from Zhurnal Prikladnoi Khimii, Vol. 78, No. 9, 2005, pp. 1499–1503.
Original Russian Text Copyright © 2005 by Goloudina, Luchinin, Pasyuta, Rozanov, Sklizkova, Kudryavtsev, Levin, Mayer, Paufler.
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Goloudina, S.I., Luchinin, V.V., Pasyuta, V.M. et al. Specific Structural Features of Langmuir-Blodgett Films of a Rigid-Chain Polyimide. Russ J Appl Chem 78, 1474–1478 (2005). https://doi.org/10.1007/s11167-005-0541-3
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DOI: https://doi.org/10.1007/s11167-005-0541-3