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Self-adapting search algorithm for Fourier ptychographic microscopy

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Abstract

Fourier ptychographic microscopy (FPM) can tackle the trade-off between the high resolution and the large field of view. However, the long capturing time limits its application. We propose a self-adapting search algorithm for FPM, termed SAS–FPM, which improves the data acquisition efficiency. Here the sparse arrangement is verified via simulations and experiments. Some results demonstrate the effectiveness and efficiency of this method. Compared to FPM with all-capturing mode, SAS–FPM could shorten the acquisition time by more than half.

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (Nos. 11874132, 61975044, and 12074094), China Scholarship Council (No. 201807320156), and Interdisciplinary Research Foundation of HIT (IR2021237). The authors are indebted to the reviewers for helpful comments and suggestions.

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Authors and Affiliations

  1. Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, 150080, China

    Ming Sun, Yutong Li, Guancheng Huang, Jiaxin Wang, Jiubin Tan & Zhengjun Liu

  2. Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin, 150080, China

    Ming Sun, Yutong Li, Guancheng Huang, Jiaxin Wang, Jiubin Tan & Zhengjun Liu

  3. School of Physics, Harbin Institute of Technology, Harbin, 150001, China

    Shutian Liu

  4. School of Data Science and Technology, Heilongjiang University, Harbin, 150080, China

    Bin Gao

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  1. Ming Sun
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  2. Yutong Li
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  3. Guancheng Huang
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  4. Jiaxin Wang
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Correspondence to Zhengjun Liu.

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Sun, M., Li, Y., Huang, G. et al. Self-adapting search algorithm for Fourier ptychographic microscopy. Opt Quant Electron 53, 704 (2021). https://doi.org/10.1007/s11082-021-03349-1

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