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Structural, electronic and optical properties of GeX (X = N, P and As) monolayer: under stress and strain conditions

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Abstract

Applying first-principles of Density Functional Theory, the current study aims to discover optical, structural and electronic features of two-dimensional (2D) hexagonal structure of IV–V binary monolayer compounds, GeX (X = N, P and As) under the conditions of stress and strain. The findings revealed that applying stress and strain conditions may make an adjustable energy gap which has a linear tendency. The valance band maximum and conduction band minimum graph is susceptible to exert strain and stress. Furthermore, a blue shift appears in the optical spectra of monolayer structures under compressive strain conditions, although a red shift is observed in the optical spectra of materials as a result of applying tensile strain. The findings show that the GeX monolayers are possibly promising applicants to be used in new optoelectronic applications.

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Correspondence to Mosayeb Naseri or Sahar Rezaee.

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Niasadegh, N., Naseri, M. & Rezaee, S. Structural, electronic and optical properties of GeX (X = N, P and As) monolayer: under stress and strain conditions. Opt Quant Electron 53, 502 (2021). https://doi.org/10.1007/s11082-021-03134-0

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  • DOI: https://doi.org/10.1007/s11082-021-03134-0

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