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1 Correction to: Optical and Quantum Electronics (2020) 52:335 https://doi.org/10.1007/s11082-020-02448-9
Figure 2 has been published incorrectly in the original publication of the article. The correct version of the figure is provided with this correction.
The FE-SEM micrographs of the CuGaGeSe4 thin films at different magnification powers, as depicted, the ternary CuGaGeSe4 thin-film samples have a homogeneous surface and free crack samples
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Hassanien, A.S., Alamri, H.R. & El Radaf, I.M. Correction to: Impact of film thickness on optical properties and optoelectrical parameters of novel CuGaGeSe4 thin films synthesized by electron beam deposition. Opt Quant Electron 52, 394 (2020). https://doi.org/10.1007/s11082-020-02503-5
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DOI: https://doi.org/10.1007/s11082-020-02503-5