Abstract
The use of the Atomic Force Microscope (AFM) as a tool to manipulate matter at the nanoscale is promising. However, the complexity of the corresponding physics and mechanics makes such nanomanipulation difficult and not very accurate. In the present paper, we analyze the dynamics of AFM-based nano-pushing manipulation. Simulation results show that the choice of the manipulation speed and loading force highly affect the manipulation outcome. In addition, simulations predict the existence of several threshold manipulation speeds. These thresholds mark the transitions between no stick-slip motion and either unique or multiple coexisting stick-slip. The obtained results bear significant implications and help get more insight into AFM-based nano-pushing.
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Cao, G.: Nanostructures and Nanomaterials: Synthesis, Properties and Applications. Imperial College Press, London (2004)
Kirilyuk, A.P.: Complex dynamics of real nanosystems: fundamental paradigm for nanoscience and nanotechnology. Nanotechnologies 2, 1085 (2004)
Bhushan, B.: Handbook of Micro/Nano Tribology, 2nd edn. CRC Press, Boca Raton (1999)
Schaefer, D.M., Reifenberger, R., Patil, A., Andres, R.P.: Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope. Appl. Phys. Lett. 66(8), 1012–1014 (1995)
Junno, T., Deppert, K., Montelius, L., Samuelson, L.: Controlled manipulation of nanoparticles with an atomic force microscope. Appl. Phys. Lett. 66(26), 3627–3629 (1995)
Sitti, M., Hashimoto, H.: Controlled pushing of nanoparticles: modeling and experiments. IEEE/ASME Trans. Mechatron. 5(2), 199–211 (2000)
Decossas, S., Mazen, F., Baron, T., Bremond, G., Souifi, A.: Atomic force microscopy nanomanipulation of silicon nanocrystals for nanodevice fabrication. Nanotechnology 14, 1272–1278 (2003)
Tafazzoli, A., Pawashe, C., Sitti, M.: Atomic force microscope based two-dimensional assembly of micro/nanoparticles. In: IEEE, Montreal (2005)
Rubio-Sierra, F.J., Heckl, W.M., Stark, R.W.: Nanomanipulation by atomic force microscopy. Adv. Eng. Mater. 7(4), 193–196 (2005)
Resch, R., Bugacov, A., Baur, C., Koel, B., Madhukar, A., Requicha, A., Will, P.: Manipulation of nanoparticles using dynamic forcemicroscopy: simulation and experiments. Appl. Phys. A 67, 265–271 (1998)
Resch, R., Baur, C., Bugacov, A., Koel, B.E., Madhukar, A., Requicha, A.A.G., Will, P.: Building and manipulating three-dimensional and linked two-dimensional structures of nanoparticles using scanning force microscopy. ACS J. Surf. Colloids 14, 6613 (1998)
Falvo, M., Clary, G., Helser, A., Paulson, S., Taylor, R., Chi, V., Brooks, J.F.P., Washburn, S., Superfine, R.: Nanomanipulation experiments exploring frictional and mechanical properties of carbon nanotubes. Microsc. Microanal 4 (1999)
Falvo, M.R., Taylor, R.M. II, Helser, A., Chi, V., Brooks, F.P. Jr, Washburn, S., Superfine, R.: Nanometre-scale rolling and sliding of carbon nanotubes. Nature 397, 236–238 (1999)
Postma, H.W.C., Teepen, T., Yao, Z., Grifoni, M., Dekker, C.: Carbon nanotube single-electron transistors at room temperature. Science 293, 76–79 (2001)
Salapaka, S., Sebastian, A., Cleveland, J.P., Salapaka, M.V.: High bandwidth nano-positioner: a robust control approach. Rev. Sci. Instrum. 73(9), 3232–3241 (2002)
Manalis, S.R., Minne, S.C., Quate, C.F.: Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor. Appl. Phys. Lett. 68(6), 871–873 (1996)
Schitter, G., Menold, P., Knapp, H.F., Allgower, F., Stemmer, A.: High performance feedback for fast scanning atomic force microscopes. Rev. Sci. Instrum. 72(8), 3320–3327 (2001)
Zou, Q., Leang, K.K., Sadoun, E., Reed, M., Devasia, S.: Control issues in high-speed AFM for biological applications: collagen imaging example. Asian J. Control 6(2), 164–178 (2004)
Yan, Y., Zou, Q., Lin, Z.: A control approach to high-speed probe-based nanofabrication. In: Proceedings of the 2009 American Control Conference Hyatt Regency Riverfront, St. Louis, MO, USA, 10–12 June 2009
Israelachvili, J.: Intermolecular and Surface Forces, 2nd edn. Academic Press, San Diego (1995)
Gnecco, E., Bennewitz, R., Gyalog, T., Loppacher, C., Bammerlin, M., Meyer, E., Guntherodt, H.-J.: Velocity dependence of atomic friction. Phys. Rev. Lett. 84, 1172–1175 (2000)
Kerssemakers, J., Hosson, J.T.M.D.: Influence of spring stiffness and anisotropy on stick-slip atomic force microscopy imaging. Appl. Phys. 80(2), 623–631 (1996)
Fujisawa, S., Sugawara, Y., Ito, S., Mishima, S., Okada, T., Morita, S.: The two-dimensional stick-slip phenomenon with atomic resolution. Nanotechnology 4, 138–142 (1993)
Morita, S., Fujisawa, S., Sugawara, Y.: Spatially quantized friction with a lattice periodicity. Surf. Sci. Rep. 23, 1–41 (1996)
Landolsi, F., Ghorbel, F.H., Lou, J., Lu, H., Sun, Y.: Nanoscale friction dynamic modeling. J. Dyn. Syst. Meas. Control 131, 061102 (2009). doi:10.1115/1.3223620
Prioli, R., Rivas, A.M.F., Freire, F.L. Jr., Caride, A.O.: Influence of velocity in nanoscale friction processes. Appl. Phys. A, Mater. Sci. Process. 76, 565–569 (2003)
Mualim, Y., Ghorbel, F.H., Dabney, J.B.: Nanomanipulation modeling and simulation. In: Proceedings of the ASME International Mechanical Engineering Congress and Exposition, Chicago, IL, USA, 5–10 November 2006
Landolsi, F., Ghorbel, F.H., Dabney, J.B.: An AFM-based nanomanipulation model describing the atomic two dimensional stick-slip behavior. In: Proceedings of the 2007 ASME International Mechanical Engineering Congress and Exposition, Seattle, WA, USA, 11–15 November 2007
Turner, J.A., Hirsekorn, S., Rabe, U., Arnold, W.: High-frequency response of atomic-force microscope cantilevers. J. Appl. Phys. 82(3), 966–979 (1997)
Burnham, N.A., Kulik, A.J., Gremaud, G., Gallo, P.-J., Oulevey, F.: Scanning local-acceleration microscopy. J. Vac. Sci. Technol. 14(2), 794–799 (1996)
Mokhtari-Nezhad, F., Saidi, A.R., Ziaei-Rad, S.: Influence of the tip mass and position on the afm cantilever dynamics: coupling between bending, torsion and flexural modes. Ultramicroscopy 109, 1193–1202 (2009)
Gnecco, E., Bennewitz, R., Gyalog, T., Meyer, E.: Friction experiments on the nanometre scale. J. Phys., Condens. Matter 13, R619–R642 (2001)
Conley, W.G., Raman, A., Krousgrill, C.M.: Nonlinear dynamics in Tomlinson’s model for atomic-scale friction and friction force microscopy. J. Appl. Phys. 98, 053519 (2005)
Hoshi, Y., Kawagishi, T., Kawakatsu, H.: Velocity dependence and limitations of friction force microscopy of mica and graphite. Jpn. J. Appl. Phys. 39, 3804–3807 (2000)
Johnson, K., Woodhouse, J.: Stick-slip motion in the atomic force microscope. Tribol. Lett. 5, 155–160 (1998)
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Landolsi, F., Ghorbel, F.H. & Dick, A.J. Analysis of the occurrence of stick-slip in AFM-based nano-pushing. Nonlinear Dyn 68, 177–186 (2012). https://doi.org/10.1007/s11071-011-0214-0
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DOI: https://doi.org/10.1007/s11071-011-0214-0