A method is proposed for determining the parameters of the smoothing window function in pulsed spectroscopy. It is based on coupling the window to the spectral and energy centers of a pulsed signal recorded in a spectrogram.
Similar content being viewed by others
References
K. Yu. Sakharov, V. A. Turkin, O. V. Mikheev, at al., “Methods and means for probing radiation absorbent materials using ultrashort electromagnetic pulses,” Izmer. Tekhn., No. 11, 60–63 (2015).
G. V. Glebovich, A. V. Andriyanov, and Yu. V. Vvedenskii, Studies of Objects Using Picosecond Pulses, Radio i Svyaz, Moscow (1984).
R. Johnk, A. Ondrejka, and S. Tofani, “Backscatter of pyramidal absorbers and metallic plates,” IEEE Trans. Electromagn. Compat., 35, No. 4, 429–433 (1993).
K. Yu. Sakharov, V. A. Turkin, O. V. Mikheev, et al., “Measurement converter for picosecond pulsed electric field voltages,” Izmer. Tekhn., No. 2, 62–64 (2014).
R. Lyons, Digital Signal Processing [Russian translation], Binom-Press, Moscow (2006).
K. Yu. Sakharov, A. V. Sukhov, V. A. Turkin, et al., “Signal processing and error analysis of measurements of the electromagnetic parameters of radiation absorbent materials in the time domain,” Izmer. Tekhn., No. 1, 44–47 (2017).
V. V. Bondarenko, I. T. Demchilo, and O. V. Pavlyuchenko, “Use of wavelet transformations for measuring the angular dependence of the reflectivity of radio-absorbing coatings in an ultrabroad frequency band,” Metrologiya, No. 3, 22–30 (2008).
H. G. Stark, Application of Wavelets for Digital Signal Processing [Russian translation], Tekhnosfera, Moscow (2007).
A. Oppenheim and R. Shafer, Digital Signal Processing [Russian translation], Tekhnosfera, Moscow (2012).
Author information
Authors and Affiliations
Corresponding author
Additional information
Translated from Metrologiya, No. 4, pp. 47–53, October–December, 2017.
Rights and permissions
About this article
Cite this article
Sakharov, K.Y., Sukhov, A.V. Choice of Window Function in Pulsed Spectroscopy of Microwave Radiation-Absorbent Materials. Meas Tech 60, 1247–1251 (2018). https://doi.org/10.1007/s11018-018-1348-y
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11018-018-1348-y