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Components of secondary x-ray spectrum in polychromatic excitation and energy-dispersive detection

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Measurement Techniques Aims and scope

It is shown that the spectra of secondary x-radiation obtained in x-ray fluorescence spectrometers with capillary optics contain peaks that are caused by diffraction of the continuous primary spectrum by the material of the sample and are a source of systematic errors and a cause of false determination of elements in quantitative and qualitative analyses.

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References

  1. A. Erko et al., Modern Developments in x-Ray and Neutron Optics, Springer-Verlag, Berlin, Heidelberg, New York (2008).

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  2. M. N. Fillipov et al., “New x-ray spectral and mass spectrum methods of chemical analysis and diagnostics of substances and synthetic materials,” in: Modern Problems of General and Inorganic Chemistry [in Russian], Nauka, Moscow (2009), pp. 402–420.

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The present study was completed with the use of equipment at the Time-Sharing Centers of the Moscow Institute of Physics and Technology, the Research Center for the Study of the Properties of Surfaces and Vacuum, and the company Systems for Microscopy and Analysis with the support of the Ministry of Education and Science of the Russian Federation (State Contract No. 16.552.11.7022).

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Authors and Affiliations

  1. Moscow Institute of Physics and Technology (MFTI), Dolgoprudnyi, Russia

    A. V. Zablotskii

  2. Institute of Experimental Mineralogy, Russian Academy of Sciences, Chernogolovka, Russia

    A. A. Viryus

  3. Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN), Moscow, Russia

    O. I. Lyamina & T. A. Kupriyanova

  4. Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV), Moscow, Russia

    A. Yu. Kuzin, P. A. Todua & M. N. Filippov

Authors
  1. A. V. Zablotskii
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  2. A. A. Viryus
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  3. O. I. Lyamina
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  4. A. Yu. Kuzin
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  5. T. A. Kupriyanova
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  6. P. A. Todua
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  7. M. N. Filippov
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Corresponding author

Correspondence to A. V. Zablotskii.

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Translated from Metrologiya, No. 4, pp. 9–15, April, 2013.

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Zablotskii, A.V., Viryus, A.A., Lyamina, O.I. et al. Components of secondary x-ray spectrum in polychromatic excitation and energy-dispersive detection. Meas Tech 56, 625–629 (2013). https://doi.org/10.1007/s11018-013-0256-4

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  • DOI: https://doi.org/10.1007/s11018-013-0256-4

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