A speckle interferometry method for the non-contact determination of the thermal expansion of nanomaterials with a rough surface is considered. Relations are derived for calculating the fundamental parameters of the speckle interferometer optical-electronic system, based on the Michelson interferometer arrangement. The results of an experiment to determine the thermal expansion of a sample are presented.
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Translated from Izmeritel’naya Tekhnika, No. 4, pp. 48–52, April, 2011.
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Kompan, T.A., Korenev, A.S., Pukhov, N.F. et al. The speckle interferometry method for determining the thermal expansion of nanomaterials. Meas Tech 54, 434–441 (2011). https://doi.org/10.1007/s11018-011-9744-6
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DOI: https://doi.org/10.1007/s11018-011-9744-6