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Employing of Diode Lasers in Speckle Photography and Application of FFT in Measurements

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Abstract

The paper discusses the spectral correlation of the speckle patterns that have been produced by illuminating different surfaces with the diode laser at different tuning range of wavelengths. The diode laser could induce a shift in the wavelength value by raising the temperature of the laser cavity using a temperature controller. Young’s interference fringes could be obtained by applying the Fast Fourier transform to the spectral correlated speckle patterns, and the visibility of the interference fringes was found to be proportional to the surface roughness values of the objects of interest and the deviation in the wavelengths used in the illumination. Both the experimental and theoretical values of the standard surfaces used in the experimental work were compared. The system of the speckle photography and the diode laser as a coherent illuminating source provided good accuracy for measuring the surface roughness values greater than 1 µm. Theory, method, results, and uncertainty are presented in details.

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References

  1. N. Russo, N. Bolognini, E. Sicre and M. Garavaglia, Surface roughness measurement through a speckle method, Int. J. Optoelectron., 5 (1990) 389–395.

    Google Scholar 

  2. D. Jason, Characterization of thick optically scattered media with laser speckle and a tunable coherence source, Master Thesis, Purdue University (1999).

  3. J. Gelbert, T. Dudderar and J. Bennewitz, The application of fiber optics to remote speckle metrology using incoherent light, Opt. Lasers Eng., 3 (1982) 183–195.

    Article  Google Scholar 

  4. J.C. Davies and C.H. Buekberry, Application of electronic speckle pattern interferometry in automotive product development, VDI Ber., 617 (1986) 279–293.

  5. R.P. Tatam, Optical fiber sensor technology, Chapman & Hall, London (1998).

  6. R.P. Tatam, J.C. Davies, C.H. Buckberry and D.C. Jones, Holographic surface contouring using wavelength modulation of laser diodes, Opt. Laser Technol., 22 (1990) 317–321.

    Article  ADS  Google Scholar 

  7. J.R. Huang, H.D. Ford and R.P. Tatam, Slope measurement by two wavelength electronic shearography, Opt. Lasers Eng., 27 (1997) 321–333.

  8. K. Galannlis, T. Bunkas and R. Ritter, Active stabilisation of ESPI systems for applications under rough conditions, Proc. SPIE, 2545 (1995) 103–107.

    ADS  Google Scholar 

  9. A. Wei, Industrial Applications of Speckle Techniques - Measurement of Deformation and Shape, Doctoral Thesis, Royal Institute of Technology Department of Production Engineering Chair of Industrial Metrology & Optics, Sweden (2002).

  10. M. Jakobi, Laser speckle based surface measurement techniques relevant to fusion devices, Doctor-Ingenieurs, Fakultät Für Elektrotechnik und Informationstechnik der Technische Universität München (2000).

  11. D. Leger, E. Mathieu and J.C. Perrin, Optical surface roughness determination using speckle correlation technique, Appl. Opt., 14 (1975) 872–877.

  12. L. Tchvialeva, Surface roughness measurement by speckle contrast under the illumination of light with arbitrary spectral profile, Opt. Lasers Eng., 48 (2010) 774–778.

    Article  Google Scholar 

  13. N. George and A. Jain, Space and wavelength dependence of speckle intensity, Appl. Phys., 4 (1974) 201–212.

    Article  ADS  Google Scholar 

  14. N. George, A. Jain and J. Melville, Experiments on the space and wavelength dependence of speckle, Appl. Phys., 7 (1975) 157–169.

    Article  ADS  Google Scholar 

  15. N. George, The wavelength sensitivity of back-scattering, Opt. Commun., 16 (1976) 328–333.

    Article  ADS  Google Scholar 

  16. N. George, Speckle from rough, moving objects, J. Opt. Soc. Am., 66 (1976) 1182–1194.

    Article  ADS  Google Scholar 

  17. N. George, A.C. Livanos, J.A. Roth and C.H. Papas, Remote sensing of large roughened spheres, Opt. Acta, 23 (1976) 367–387.

    Article  Google Scholar 

  18. N. George and A. Jain, Speckle reduction using multiple tones of illumination, Appl. Opt., 12(5) (1973) 1202–1212.

    Article  ADS  Google Scholar 

  19. E.M. Strzelecki, D.A. Cohen and L.A. Coldren, Investigation of tunable single frequency diode lasers for sensor applications, J. Light. Technol., 6 (1998) 1610–1618.

    Article  Google Scholar 

  20. J.C. Marron and K.S. Schroeder, Three-dimensional lensless imaging using laser frequency diversity, Appl. Opt., 31 (1992) 55–262.

    Article  Google Scholar 

  21. L.G. Shirley and P.A. Lo, Bispectral analysis of the wavelength dependence of speckle: remote sensing of object shape, Opt. Soc. Am., 11 (1994) 1025–1046.

    Article  ADS  Google Scholar 

  22. L.G. Shirley and G.R. Hallerman, Applications of Tunable Lasers to Laser Radar and 3D Imaging, Technical Report 1025, MIT Lincoln Laboratory, DTIC #AD-A306557 (1996).

  23. JCGM 100, Evaluation of measurement data —Guide to the expression of uncertainty in measurement (2008), http://www.bipm.org/utils/common/documents/jcgm/JCGM_100_2008_E.pdf.

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Authors and Affiliations

  1. Dimensional Metrology Lab, National Institute For Standards, Tersa st, Haram, P.O.B 136, Giza, 12211, Egypt

    N. Farid & M. Bahrawi

  2. Primary Length Standard & Laser Technology Lab, National Institute For Standards, Tersa st, Haram, P.O.B 136, Giza, 12211, Egypt

    H. Hussein

Authors
  1. N. Farid
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  2. H. Hussein
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  3. M. Bahrawi
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Correspondence to N. Farid.

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Farid, N., Hussein, H. & Bahrawi, M. Employing of Diode Lasers in Speckle Photography and Application of FFT in Measurements. MAPAN 30, 125–129 (2015). https://doi.org/10.1007/s12647-014-0128-7

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  • DOI: https://doi.org/10.1007/s12647-014-0128-7

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