Abstract
Limitations for the accuracy and reliability of measurements in dilatometers that arise during processing of large amounts of visual information are analyzed. Possible sources of measurement error for phase shift in the interference pattern during a study of thermal expansion of a specimen and methods for providing continuous monitoring of quality and increasing the reliability of measurement results are considered.
Similar content being viewed by others
References
H. Fizeau, Ann. Chim. Phys., 8, No. 4, 335 (1898).
Yu. V. Kolomiitsov, Interferometry [in Russian], Mashinostroenie, Leningrad (1976).
S. J. Bennet, J. Phys. E: Sci. Instrum., 10, 525 (1977).
K. Uchino, S. Nishida, and S. Nomura, Jap. J. Appl. Phys., 21, No. 4, 596 (1982).
M. Okaji and H. Imai, J. Phys. E: Sci. Instrum., 20, 887 (1987).
T. A. Hahn, Cindas Data Series in Material Properties, Vol. 1–4, R. E. Taylor (ed.), ASM International, Materials Park, Ohio (1998).
M. Okaji, N. Yamada, and H. Moriyama, Metrologia, 37, 165 (2000).
A. N. Amatuni, T. A. Kompan, and E. B. Shevchenko, Measurement Techniques, 23, No. 1, 71 (1980).
A. N. Amatuni et al., Measurement Techniques, 29, No. 9, 847 (1986).
A. N. Amatuni et al., Élektron. Tekh., Ser. 8, No. 5(147), 16 (1991).
T. A. Kompan, A. S. Korenev, and A. Ya. Lukin, Measurement Techniques, 29, No. 9, 847 (2001).
Author information
Authors and Affiliations
Additional information
__________
Translated from Izmeritel’naya Tekhnika, No. 4. pp. 18–22, April, 2007.
Rights and permissions
About this article
Cite this article
Kompan, T.A., Korenev, A.S. & Lukin, A.Y. Monitoring the accuracy and provision of reliability for results of measuring the phase shift in an interference dilatometer. Meas Tech 50, 372–377 (2007). https://doi.org/10.1007/s11018-007-0077-4
Received:
Issue Date:
DOI: https://doi.org/10.1007/s11018-007-0077-4